DataVXMicroscopy and MicroanalysisPaper
journal article·2020-08Open access

Dose Rate Considerations for Semiconductor Electronics: Why Current Variations Enable Unique GaN-based Transmission Electron Microscopy

Petra Specht, Ronny Kirste, Zlatko Sitar, Travis Anderson, Andrew Koehler, Christian Kisielowski

Microscopy and Microanalysis· Volume 26· Issue S2
Publisher pageOpen full text
Source abstract

Abstract

Petra Specht, Ronny Kirste, Zlatko Sitar, Travis Anderson, Andrew Koehler, Christian Kisielowski; Dose Rate Considerations for Semiconductor Electronics: W
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Electronic materials

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ga2O3 and related materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (6)

Show source-provided references
1. [6] Project funding by ONR #N00014-15-1-2714 and DoE NNSA #PL16-V-GaNPhotodiodePD3Ja is acknowledged.
2. 10.1021/acs.nanolett.9b0307410.1021/acs.nanolett.9b03074 ↗
3. Zhang · Science · 2018 · 359
4. [5] Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
5. 10.1002/adfm.20180781810.1002/adfm.201807818 ↗
6. 10.1017/S143192761801034610.1017/S1431927618010346 ↗