4D-STEM Differential Phase Contrast Microscopy Across Ferroelectric Domain Walls
Source abstract
Abstract
Debangshu Mukherjee, Colin Ophus, Jim Ciston, Zhiqiang Mao, Venkatraman Gopalan, Nasim Alem; 4D-STEM Differential Phase Contrast Microscopy Across Ferroele
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Near-Field Optical Microscopy
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1039/C5TC03856A10.1039/C5TC03856A ↗
2. 10.1038/ncomms665310.1038/ncomms6653 ↗
3. 10.1038/ncomms1563110.1038/ncomms15631 ↗