DataVXMicroscopy and MicroanalysisPaper
journal article·2018-08Open access

You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization

Paul R. Edwards, G. Naresh-Kumar, Gunnar Kusch, Jochen Bruckbauer, Lucia Spasevski, Catherine G. Brasser, Michael J. Wallace, Carol Trager-Cowan, Robert W. Martin

Microscopy and Microanalysis· Volume 24· Issue S1
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Abstract

Paul R Edwards, G Naresh-Kumar, Gunnar Kusch, Jochen Bruckbauer, Lucia Spasevski, Catherine G Brasser, Michael J Wallace, Carol Trager-Cowan, Robert W Mart
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Electronic materials

OpenAlex topics: GaN-based semiconductor devices and materials · Electron and X-Ray Spectroscopy Techniques · Metal and Thin Film Mechanics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (3)

Show source-provided references
1. 10.1063/1.486716510.1063/1.4867165 ↗
2. 10.1063/1.489049710.1063/1.4890497 ↗
3. 10.1016/j.mssp.2016.02.00710.1016/j.mssp.2016.02.007 ↗