DataVXMicroscopy and MicroanalysisPaper
journal article·2018-08Open access

In Situ TEM Probing of Ferroelectric Switching under Electrical Bias

Xiaoqing Pan, Lin-Ze Li, Mingjie Xu, Sheng Dai, Thomas Blum

Microscopy and Microanalysis· Volume 24· Issue S1
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Abstract

Xiaoqing Pan, Lin-Ze Li, Mingjie Xu, Sheng Dai, Thomas Blum; In Situ TEM Probing of Ferroelectric Switching under Electrical Bias, Microscopy and Microanal
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Electronic materials

OpenAlex topics: Non-Destructive Testing Techniques · Multiferroics and related materials · Electronic and Structural Properties of Oxides

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References (1)

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1. 10.1021/acs.nanolett.7b0069610.1021/acs.nanolett.7b00696 ↗