DataVXMicroscopy and MicroanalysisPaper
journal article·2017-07Open access

In-situ TEM Analyses over FIB Lamellae - Investigating High Temperature Conversion of Solution Processed Mo-precursor to MoS2 Semiconductor Films.

Anuj Pokle, Megan Canavan, Dermot Daly, Francis Oliver Vinay Gomes, Marko Marinkovic, Veit Wagner, Valeria Nicolosi

Microscopy and Microanalysis· Volume 23· Issue S1
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Abstract

Anuj Pokle, Megan Canavan, Dermot Daly, Francis Oliver Vinay Gomes, Marko Marinkovic, Veit Wagner, Valeria Nicolosi; In-situ TEM Analyses over FIB Lamellae
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

Electronic materials

OpenAlex topics: 2D Materials and Applications · Ferroelectric and Negative Capacitance Devices · MXene and MAX Phase Materials

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References (4)

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1. 10.1038/nature1441710.1038/nature14417 ↗
2. 10.1073/pnas.050284810210.1073/pnas.0502848102 ↗
3. The authors would like to acknowledge support from the European Research Council, the Marie Curie FP7 ITN MoWSeS project, the SFI PIYRA, CRANN/AMBER Centre and the Advance Microscopy Lab-Dublin.
4. 10.1126/science.119497510.1126/science.1194975 ↗