DataVXMicroscopy and MicroanalysisPaper
journal article·2017-07Open access

2D Junction Profiling on Semiconductor Device Reliability Fail

Y.Y. Wang, J. Nxumalo, A. Katnani, D. Ioannou, J. Brown, K. Bandy, M. Macdonald, J. Bruley

Microscopy and Microanalysis· Volume 23· Issue S1
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Abstract

YY Wang, J Nxumalo, A Katnani, D Ioannou, J Brown, K Bandy, M Macdonald, J Bruley; 2D Junction Profiling on Semiconductor Device Reliability Fail, Microsco
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Research context

Electronic materials

OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Industrial Vision Systems and Defect Detection · VLSI and Analog Circuit Testing

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (6)

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