Large-Collection-Angle BF STEM Imaging of Compound Semiconductors
Source abstract
Abstract
T Aoki, MR McCartney, David J Smith; Large-Collection-Angle BF STEM Imaging of Compound Semiconductors, Microscopy and Microanalysis, Volume 21, Issue S3,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (2)
Show source-provided references
1. 10.1016/0304-3991(93)90044-X10.1016/0304-3991(93)90044-X ↗
2. 10.1093/jmicro/dft01110.1093/jmicro/dft011 ↗