Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem
Source abstract
Abstract
L Rigutti, L Mancini, E Di Russo, I Blum, F Moyon, W Lefebvre, D Blavette, F Vurpillot, E Giraud, JF Carlin, R Butté, N Grandjean, N Gogneau, L Largeau, F
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Surface and Thin Film Phenomena · Hydrogen embrittlement and corrosion behaviors in metals
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (8)
Show source-provided references
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