DataVXMicroscopy and MicroanalysisPaper
journal article·2013-08Open access

Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes

A.S. Khalil, L.T. Chadderton, A.M. Stewart, D.J. Llewellyn, M.C. Ridgway, A.P. Byrne

Microscopy and Microanalysis· Volume 19· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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Source: crossref · Quality: short

Research context

Electronic materials

OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques

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