Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography
Source abstract
Abstract
AC Twitchett, RE Dunin-Borkowski, PA Midgley; Quantitative Examination of Reverse-Biased Semiconductor Devices using Off- Axis Electron Holography, Microsc
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Surface and Thin Film Phenomena
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