Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta2O9 with Cross-Sectional Atomic Force Microscopy
Source abstract
Abstract
DL Pechkis, C Caragianis-Broadbridge, AH Lehman, K L Klein, J-P Han, T P Ma; Thin Film Thickness and Grain Structure Determination of Ferroelectric SrBi2Ta
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Adhesion, Friction, and Surface Interactions · Acoustic Wave Resonator Technologies
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