HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr₂FeMoO₆ (SFMO) and Sr₂CrReO₆ (SCRO)

R Williams; A Hauser; R Richiardo; M Dixit; J Lucy; P Woodward; F Yang; H Fraser

doi:10.1017/s1431927611009147

journal article·2011-07Open access

HR-STEM Imaging and EELS Characterizing of Nano-Scale Defects in Sputter Deposited Thin Films of Double-Perovskite Sr₂FeMoO₆ (SFMO) and Sr₂CrReO₆ (SCRO)

R Williams, A Hauser, R Richiardo, M Dixit, J Lucy, P Woodward, F Yang, H Fraser

Microscopy and Microanalysis· Volume 17· Issue S2

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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Research context

Electronic materials

OpenAlex topics: Magnetic and transport properties of perovskites and related materials · Electronic and Structural Properties of Oxides · Advanced Materials Characterization Techniques

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