Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM

Everett D. Grimley; Sam Frisone; Tony Schenk; Min Hyuk Park; Chris M. Fancher; Thomas Mikolajick; Jacob L. Jones; Uwe Schroeder; James M. LeBeau

doi:10.1017/s1431927618001411

journal article·2018-08Open access

Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM

Everett D. Grimley, Sam Frisone, Tony Schenk, Min Hyuk Park, Chris M. Fancher, Thomas Mikolajick, Jacob L. Jones, Uwe Schroeder, James M. LeBeau

Microscopy and Microanalysis· Volume 24· Issue S1

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Abstract

Everett D Grimley, Sam Frisone, Tony Schenk, Min Hyuk Park, Chris M Fancher, Thomas Mikolajick, Jacob L Jones, Uwe Schroeder, James M LeBeau; Insights into

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Source: openalex_inverted_index · Quality: short

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Electronic materials

OpenAlex topics: Ferroelectric and Negative Capacitance Devices · Cardiac Structural Anomalies and Repair · MXene and MAX Phase Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (6)

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