DataVXMicroscopy and MicroanalysisPaper
journal article·2018-08Open access

Multivariate Analysis and Compressed Sensing Methods for Spectroscopic Electron Tomography of Semiconductor Devices

Martin Jacob, Toby Sanders, Nicolas Bernier, Adeline Grenier, Rafael Bortolin Pinheiro, Frederic Mazen, Pascale Bayle-Guillemaud, Zineb Saghi

Microscopy and Microanalysis· Volume 24· Issue S1
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Martin Jacob, Toby Sanders, Nicolas Bernier, Adeline Grenier, Rafael Bortolin Pinheiro, Frederic Mazen, Pascale Bayle-Guillemaud, Zineb Saghi; Multivariate
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OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · CCD and CMOS Imaging Sensors · Geophysical and Geoelectrical Methods

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