Automated Bandgap Measurements in Optoelectronic Devices by Monochromated Electron Energy-Loss Spectroscopy

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Research context

OpenAlex topics: Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and interfaces

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Affiliations

Advanced Microscopy, Eurofins EAG Laboratories , Sunnyvale CA , USA

Advanced Microscopy, Eurofins EAG Laboratories , Raleigh NC , USA

Advanced Microscopy, Eurofins Nanolab Technologies , Milpitas CA , USA

References (5)