Multimodal Analysis of InAs/InGaAlAs Quantum Dots Using Transmission Electron Microscopy and Atom Probe Tomography

Journal Article Multimodal Analysis of InAs/InGaAlAs Quantum Dots Using Transmission Electron Microscopy and Atom Probe Tomography Get access Yudai Yamaguchi, Yudai Yamaguchi Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Corresponding author: Yudai.Yamaguchi@sony.com Search for other works by this author on: Oxford Academic Google Scholar Yuta Inaba, Yuta Inaba Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Ryoji Arai, Ryoji Arai Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Yuya Kanitani, Yuya Kanitani Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Yoshihiro Kudo, Yoshihiro Kudo Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Michinori Shiomi, Michinori Shiomi Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Daiji Kasahara, Daiji Kasahara Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Mikihiro Yokozeki, Mikihiro Yokozeki Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Noriyuki Fuutagawa, Noriyuki Fuutagawa Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Jun Uzuhashi, Jun Uzuhashi National Institute for Materials Science, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar ... Show more Tadakatsu Ohkubo, Tadakatsu Ohkubo National Institute for Materials Science, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Kazuhiro Hono, Kazuhiro Hono National Institute for Materials Science, Tsukuba, Ibaraki, Japan Search for other works by this author on: Oxford Academic Google Scholar Kouichi Akahane, Kouichi Akahane National Institute of Information and Communications Technology, Koganei, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Naokatsu Yamamoto, Naokatsu Yamamoto National Institute of Information and Communications Technology, Koganei, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Shigetaka Tomiya Shigetaka Tomiya Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1970–1971, https://doi.org/10.1093/micmic/ozad067.1020 Published: 22 July 2023