Electrostatic Contribution to the Photo-Assisted Piezoresponse Force Microscopy by Photo-Induced Surface Charge
Source abstract
Abstract
Abstract The surging interest in manipulating the polarization of piezo/ferroelectric materials by means of light has driven an increasing number of studies toward their light-polarization interaction. One way to investigate such interaction is by performing piezoresponse force microscopy (PFM) while/after the sample is exposed to light illumination. However, caution must be exercised when analyzing and interpreting the data, as demonstrated in this paper, because sizeable photo-response observed in the PFM amplitude image of the sample is shown to be caused by the electrostatic interaction between the photo-induced surface charge and tip. Through photo-assisted Kelvin probe force microscopy (KPFM), positive surface potential is found to be developed near the sample's surface under 405 nm light illumination, whose effects on the measured PFM signal is revealed by the comparative studies on its amplitude curves that are obtained using PFM spectroscopy mode with/without illumination. This work exemplifies the need for complementary use of KPFM, PFM imaging mode, and PFM spectroscopy mode in order to distinguish real behavior from artifacts.
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Mechanical and Optical Resonators · Advanced MEMS and NEMS Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Monash University Mechanical Engineering Discipline, School of Engineering, , Bandar Sunway, Selangor 47500, Malaysia
Institute of Nano Optoelectronics Research and Technology (INOR), Universiti Sains Malaysia , 11800 USM, Penang, Malaysia
Ming Chi University of Technology Department of Mechanical Engineering and Research Center for Intelligent Medical devices, , New Taipei City 24301, Taiwan
Funding
Collaborative Research in Engineering, Science and Technology
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