Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector

Journal Article Local Structural Study of Ferroelectric Domain Boundaries Using STEM-CBED with a Fast Pixelated STEM Detector Get access Kenji Tsuda, Kenji Tsuda Frontier Institute for Interdisciplinary Research, Tohoku University, Sendai, Japan Corresponding author: k_tsuda@tohoku.ac.jp Search for other works by this author on: Oxford Academic Google Scholar Ryusuke Sagawa, Ryusuke Sagawa JEOL Ltd., Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Hiroki Hashiguchi, Hiroki Hashiguchi JEOL Ltd., Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Yukihito Kondo Yukihito Kondo JEOL Ltd., Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1996–1997, https://doi.org/10.1017/S1431927619010717 Published: 01 August 2019