journal article·2017-07Open access

Exploration of Doped Semiconductors at the Atomic Scale

Alfonso Rodil, Christian Krammel, Rianne Plantenga, Sebastian Kôlling, Paul Koenraad

Microscopy and Microanalysis· Volume 23· Issue S1

Abstract

Alfonso Rodil, Christian Krammel, Rianne Plantenga, Sebastian Kôlling, Paul Koenraad; Exploration of Doped Semiconductors at the Atomic Scale, Microscopy a
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Materials Characterization Techniques · Semiconductor materials and devices

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References (2)

Show source-provided references
1. 10.1038/nmat294010.1038/nmat2940 ↗
2. 10.1021/acs.nanolett.6b0310910.1021/acs.nanolett.6b03109 ↗