DataVXMicroscopy and MicroanalysisPaper
journal article·2019-08Open access

Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM

Yu-Tsun Shao, Zhen Chen, Antonio Mei, Megan Holtz, Elliot Padgett, Darrell Schlom, David A. Muller

Microscopy and Microanalysis· Volume 25· Issue S2
Publisher pageOpen full text
Bibliographic record

Abstract

No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.

Source: Not provided · Quality: missing

Research context

Electronic materials

OpenAlex topics: Ferroelectric and Piezoelectric Materials · Multiferroics and related materials · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (7)

Show source-provided references
1. 10.1017/S143192761501566410.1017/S1431927615015664 ↗
2. 10.1103/PhysRevLett.118.15760110.1103/PhysRevLett.118.157601 ↗
3. 10.1103/PhysRevB.94.15530710.1103/PhysRevB.94.155307 ↗
4. 10.1038/s41586-018-0855-y10.1038/s41586-018-0855-y ↗
5. 10.1126/science.117704610.1126/science.1177046 ↗
6. This work is supported by the AFOSR Hybrid Materials MURI, award # FA9550-18-1-0480. Facilities support from the National Science Foundation (DMR-1429155, DMR-1719875)
7. 10.1016/j.ultramic.2015.03.01610.1016/j.ultramic.2015.03.016 ↗