journal article·1999-08-01

Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm

YC Wang, A Fitzgerald, EC Nelson, C Song, MA O’Keefe, C Kisielowski

Microscopy and Microanalysis· Volume 5· Issue S2
Publisher page

Abstract

Abstract High resolution electron microscopes with field emission sources opened the possibility to investigate solids on a 100 pm range. Either electron holograpy can be applied or an information limit that may even extend into a region below 100 pm can be exploited to reach this goal [1]. However, lens aberrations such as the three-fold astigmatism often complicate an image interpretation in the 100 pm range or even make it impossible [2]. On the other hand, there is growing need to understand physical processes at a mono-atomic level in order to further develop artificially structured materials such as nano-crystals, ceramic coatings or semiconductors. Commonly, such materials contain light elements like C, N, or O with bond lengths that are shorter than a typical 180 pm point resolution of a high resolution, electron microscope. The carbon-carbon distance of 150 pm is the shortest bond length value in crystalline solids. Moreover, any projection of a diamond lattice along a low index zone axis for lattice imaging leads to a reduced C-C distance.
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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

FEI and Philips

University of Dundee /UK

National Center for Electron Microscopy , Berkeley, CA 94720/, USA

References (5)

Show source-provided references
1. Hawkes · 1989 · 297
2. Wang · 1998 · 57
3. 10.1016/0304-3991(90)90035-K10.1016/0304-3991(90)90035-K ↗
4. 10.1017/S042482010016455610.1017/S0424820100164556 ↗
5. Diffractograms in figure 2 are a courtesy of Dr. Pan, M. , Gatan,