Probing of Individual Semiconductor Nanowhiskers by TEM-STM
Source abstract
Abstract
Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are needed. Here we report an alternative procedure for electrical measurements on semiconductor nanowhiskers, allowing precise selection and visual control at close to atomic resolution. We use a combination of two powerful microscope techniques, scanning tunneling microscopy (STM) and simultaneous viewing in a transmission electron microscope (TEM). The STM is mounted in the sample holder for the TEM. We describe here a method for creating an ohmic contact between the STM tip and the nanowhisker. We examine three different types of STM tips and present a technique for cleaning the STM tip in situ. Measurements on 1-μm-tall and 40-nm-thick epitaxially grown InAs nanowhiskers show an ohmic contact and a resistance of down to 7 kΩ.
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Research context
OpenAlex topics: Nanowire Synthesis and Applications · Force Microscopy Techniques and Applications · Surface and Thin Film Phenomena
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (17)
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1. Libioulle, L. , Houbion, Y. , & Gilles, J.-M. (1995).Very sharp gold and platinum tips to modify gold surfaces inscanning tunneling microscopy.J Vacuum Sci Technol B: Microelectronics Nano Struct 13,1325–1331.10.1116/1.587847 ↗
2. Wagner, R.S. (1970).VLS mechanism of crystal growth. InWhisker Technology, Levitt, A.P. (Eds.), pp.47–119.New York:Wiley.
3. Guise, O.L. , Ahner, J.W. , Jung, M.-C. , Goughnour, P.C. , & Yates, J.T.J. (2002).Reproducible electrochemical etching of tungsten probe tips.Nano Lett 2,191–193.10.1021/nl010094q ↗
4. Knapp, H.F. (1998).Electro-chemical etching of Au tips. InProcedures in Scanning Probe Microscopies, Colton, R.J. , Engel, A. , Frommer, J.E. , Gaub, H.E. , Gewirth, A.A. , Guckenberger, R. , Heckl, W. , Parkinson, B. & Rabe, A. (Eds.), pp.69–72.Chichester, UK:Wiley.
5. Björk, M.T. , Ohlsson, B.J. , Sass, T. , Persson, A.I. , Thelander, C. , Magnusson, M.H. , Deppert, K. , Wallenberg, L.R. , & Samuelson, L. (2002a).One-dimensional steeplechase for electrons realized.Nano Lett 2,87–89.10.1021/nl010099n ↗
6. Björk, M.T. , Ohlsson, B.J. , Thelander, C. , Persson, A.I. , Deppert, K. , Wallenberg, L.R. , & Samuelson, L. (2002b).Nanowire resonant tunneling diodes.Appl Phys Lett 81,4458–4460.10.1063/1.1527995 ↗
7. Shimizu, T. , Ando, A. , Abe, H. , Nakayama, Y. , & Tokumoto, H. (2002).Nanometer scale electrical measurement using nanomanipulator:Current–voltage characteristics of carbon nanotube. InProceedings of nano-7/ecoss-21, Deppert, K. (Ed.).Malmö, Sweden.
8. Isabell, T.C. , Fischione, P.F. , O'Keefe, K. , Guruz, M.U. , & Dravid, V.P. (1999).Plasma cleaning and its applications for electron microscopy.Microsc Microanal 5,126–135.10.1017/S1431927699000094 ↗
9. Kizuka, T. , Yamada, K. , Deguchi, S. , Naruse, M. , & Tanaka, N. (1997).Cross-sectional time-resolved high-resolution transmission electronmicroscopy of atomic-scale contact and noncontact-type scannings ongold surfaces.Phys Rev B 55,R7398–R7401.10.1103/PhysRevB.55.R7398 ↗
10. Binnig, G. , Rohrer, H. , Gerber, C. , & Weibel, E. (1982).Surface studies by scanning tunneling microscopy.Phys Rev Lett 49,57–61.10.1103/PhysRevLett.49.57 ↗
11. Spence, J.C.H. (1988).A scanning tunneling microscope in a side-entry holder forreflection electron-microscopy in the Philips Em400.Ultramicroscopy 25,165–169.10.1016/0304-3991(88)90224-0 ↗
12. Erts, D. , Lohmus, A. , Lohmus, R. , & Olin, H. (2001).Instrumentation of STM and AFM combined with transmission electronmicroscope.Appl Phys A Mater Sci Process 72,S71–S74.10.1007/s003390100636 ↗
13. Wu, Y. , Fan, R. , & Yang, P. (2002).Block-by-block growth of single-crystalline Si/SiGesuperlattice nanowires.Nano Lett 2,83–86.10.1021/nl0156888 ↗
14. 10.1088/0957-0233/10/1/00610.1088/0957-0233/10/1/006 ↗
15. Magnusson, M.H. , Deppert, K. , Malm, J.-O. , Bovin, J.-O. , & Samuelson, L. (1999).Gold nanoparticles: Production, reshaping, and thermal.Charging J Nanoparticle Res 1,243–251.10.1023/A:1010012802415 ↗
16. Kizuka, T. (1998).Atomic process of point contact in gold studied by time-resolvedhigh-resolution transmission electron microscopy.Phys Rev Lett 81,4448–4451.10.1103/PhysRevLett.81.4448 ↗
17. Duan, X. , Huang, Y. , Cui, Y. , Wang, J. , & Lieber, C. (2001).Indium phosphide nanowires as building blocks for nanoscaleelectronic and optoelectronic devices.Nature 409,66–69.10.1038/35051047 ↗