Atomistic-Simulation Based Modeling of Atom Probe Tomography

Atom probe tomography (APT) promises atom-by-atom material analysis with spatial resolution and chemical sensitivity that no other technique can achieve It is increasingly used in research as well as in industry to explore 3D chemistry of engineering materials, semiconductors, and even organic samples at the nanoscale Technological advances in ion imaging, particle detectors, and fast laser pulsing over the past decade have positioned APT on par with other high-resolution imaging techniques in terms of ease of specimen preparation and size of the volume analyzed.