Attenuation of Photoelectron Emission by a Single Organic Layer
Source abstract
Abstract
We report an in situ study of the thin-film growth of cobalt-phthalocyanine on Ag(100) surfaces using photoelectron emission microscopy (PEEM) and the Anderson method. Based on the Fowler-DuBridge theory, we were able to correlate the evolution of the mean electron yield acquired with PEEM for coverages up to two molecular layers of cobalt-phthalocyanine to the global work function changes measured with the Anderson method. For coverages above two monolayers, the transients measured with the Anderson method and those obtained with PEEM show different trends. We exploit this discrepancy to determine the inelastic mean free path of the low-energy electrons while passing through the third layer of CoPc.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Electronic and Structural Properties of Oxides
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Strasse 69, 4040 Linz, Austria
University of Wroclaw, Institute of Experimental Physics, Pl. M. Borna 9, 50-204 Wroclaw, Poland
Funding
Austrian Science Fund · OeAD-GmbH
References (43)
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