journal article·2023-07-12

Temperature-Driven Anisotropic Mg2+ Doping for a Pillared LiCoO2 Interlayer Surface in High-Voltage Applications

Lianqi Zhao, Pu Yan, Tianying Liu, Xingzhi Wang, Zeyu Wang, Cong Wu, Wenda Bao, Haiyin Zhu, Yue Zhang, Jin Xie

ACS Applied Materials & Interfaces· Volume 15· Issue 27
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Abstract

High-voltage lithium cobalt oxide (LiCoO 2 ) has the highest volumetric energy density among commercial cathode materials in lithium-ion batteries due to its high working voltage and compacted density. However, under high voltage (4.6 V), the capacity of LiCoO 2 fades rapidly due to parasitic reactions of high-valent cobalt with the electrolyte and the loss of lattice oxygen at the interface. In this study, we report a temperature-driven anisotropic doping phenomenon of Mg 2+ that results in surface-populated Mg 2+ doping to the side of the (003) plane of LiCoO 2 . Mg 2+ dopants enter the Li + sites, lower the valence state of Co ions with less hybridization between the O 2p and Co 3d orbitals, promote the formation of surface Li + /Co 2+ anti-sites, and suppress lattice oxygen loss on the surface. As a result, the modified LiCoO 2 demonstrates excellent cycling performance under 4.6 V, reaching an energy density of 911.2 Wh/kg at 0.1C and retaining 92.7% (184.3 mAh g –1 ) of its capacity after 100 cycles at 1C. Our results highlight a promising avenue for enhancing the electrochemical performance of LiCoO 2 by anisotropic surface doping with Mg 2+ .
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Research context

OpenAlex topics: Advancements in Battery Materials · Advanced Battery Materials and Technologies · Supercapacitor Materials and Fabrication

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Affiliations

School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China

Shanghai Key Laboratory of High-resolution Electron Microscopy, ShanghaiTech University, Shanghai 201210, China

Funding

ShanghaiTech University · National Natural Science Foundation of China · Center for High-Resolution Electron Microscopy, ShanghaiTech University · Analytical Instrumentation Center, School of Physical Science and Technology, ShanghaiTech University

References (38)

Show source-provided references
1. 10.1038/s41560-020-00748-810.1038/s41560-020-00748-8 ↗
2. 10.1038/s41560-021-00832-710.1038/s41560-021-00832-7 ↗
3. 10.1038/s41586-021-03486-310.1038/s41586-021-03486-3 ↗
4. 10.1038/s41586-021-03509-z10.1038/s41586-021-03509-z ↗
5. 10.1038/s41586-021-03584-210.1038/s41586-021-03584-2 ↗
6. 10.1016/j.nanoen.2018.11.08510.1016/j.nanoen.2018.11.085 ↗
7. 10.1002/advs.20220055310.1002/advs.202200553 ↗
8. 10.1021/cm901452z10.1021/cm901452z ↗
9. 10.1039/C9TA06579B10.1039/C9TA06579B ↗
10. 10.1039/C8CS00322J10.1039/C8CS00322J ↗
11. 10.1002/adma.20220484510.1002/adma.202204845 ↗
12. 10.1002/smtd.20220014810.1002/smtd.202200148 ↗
13. 10.1038/s41560-019-0409-z10.1038/s41560-019-0409-z ↗
14. 10.1038/s41560-018-0180-610.1038/s41560-018-0180-6 ↗
15. 10.1002/aenm.20200098210.1002/aenm.202000982 ↗
16. 10.1038/s41565-021-00855-x10.1038/s41565-021-00855-x ↗
17. 10.1149/1.173842310.1149/1.1738423 ↗
18. 10.1149/1.183797610.1149/1.1837976 ↗
19. 10.1038/s41467-018-07296-610.1038/s41467-018-07296-6 ↗
20. 10.1149/1.183659410.1149/1.1836594 ↗
21. 10.1002/aenm.20220019710.1002/aenm.202200197 ↗
22. 10.1039/D0EE00231C10.1039/D0EE00231C ↗
23. 10.1002/aenm.20200141310.1002/aenm.202001413 ↗
24. 10.1002/aenm.20220081310.1002/aenm.202200813 ↗
25. 10.1016/j.apsusc.2022.15627810.1016/j.apsusc.2022.156278 ↗
26. 10.1021/acs.nanolett.0c0377810.1021/acs.nanolett.0c03778 ↗
27. 10.1002/adfm.20200197410.1002/adfm.202001974 ↗
28. 10.1002/aenm.20220154910.1002/aenm.202201549 ↗
29. 10.1103/PhysRevB.40.571510.1103/PhysRevB.40.5715 ↗
30. 10.1002/adfm.20221103310.1002/adfm.202211033 ↗
31. 10.1149/1.139113010.1149/1.1391130 ↗
32. 10.1103/PhysRevB.61.179510.1103/PhysRevB.61.1795 ↗
33. 10.1016/j.electacta.2012.10.11110.1016/j.electacta.2012.10.111 ↗
34. 10.1016/S0169-4332(99)00593-010.1016/S0169-4332(99)00593-0 ↗
35. 10.1016/j.electacta.2020.13729210.1016/j.electacta.2020.137292 ↗
36. 10.1038/s41467-021-26894-510.1038/s41467-021-26894-5 ↗
37. 10.1002/adfm.20190790310.1002/adfm.201907903 ↗
38. 10.1002/adma.20200518210.1002/adma.202005182 ↗