journal article·2023-05-03

Imaging the Surface/Interface Morphologies Evolution of Silicon Anodes Using in Situ/Operando Electron Microscopy

Dahai Yang, Yun Xin Angel Ng, Kuanxin Zhang, Qiang Chang, Junhao Chen, Tong Liang, Sheng Cheng, Yi Sun, Wangqiang Shen, Edison Huixiang Ang, Hongfa Xiang, Xiaohui Song

ACS Applied Materials & Interfaces· Volume 15· Issue 17
Publisher page

Abstract

Si-based rechargeable lithium-ion batteries (LIBs) have generated interest as silicon has remarkably high theoretical specific capacity. It is projected that LIBs will meet the increasing need for extensive energy storage systems, electric vehicles, and portable electronics with high energy densities. However, the Si-based LIB has a substantial problem due to the volume cycle variations brought on by Si, which result in severe capacity loss. Making Si-based anodes-enabled high-performance LIBs that are easy to utilize requires an understanding of the fading mechanism. Due to its distinct advantage in morphological changes from microscale to nanoscale, even approaching atomic resolution, electron microscopy is one of the most popular methods. Based on operando electron microscopy characterization, the general comprehension of the fading mechanism and the morphology evolution of Si-based LIBs are debated in this review. The current advancements in compositional and structural interpretation for Si-based LIBs using advanced electron microscopy characterization methods are outlined. The future development trends in pertinent silicon materials characterization methods are also highlighted, along with numerous potential research avenues for Si-based LIBs design and characterization.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Advancements in Battery Materials · Electron and X-Ray Spectroscopy Techniques · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Materials Science and Engineering, Hefei University of Technology, Hefei, Anhui Province 230009, China

Natural Sciences and Science Education, National Institute of Education, Nanyang Technological University, Singapore 637616, Singapore

Instrumental Analysis Center, Hefei University of Technology, Hefei, Anhui Province 230009, China

Funding

Hefei University of Technology · Anhui Provincial Department of Science and Technology · National Institute of Education

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