journal article·2017-11-15Open access

Revealing the Bonding Environment of Zn in ALD Zn(O,S) Buffer Layers through X-ray Absorption Spectroscopy

Anup Dadlani, Shinjita Acharya, Orlando Trejo, Dennis Nordlund, Mirco Peron, Nima Razavi, Filippo Berto, Fritz B. Prinz, Jan Torgersen

Abstract

Zn(O,S) buffer layer electronic configuration is determined by its composition and thickness, tunable through atomic layer deposition. The Zn K and L-edges in the X-ray absorption near edge structure verify ionicity and covalency changes with S content. A high intensity shoulder in the Zn K-edge indicates strong Zn 4s hybridized states and a preferred c-axis orientation. 2-3 nm thick films with low S content show a subdued shoulder showing less contribution from Zn 4s hybridization. A lower energy shift with film thickness suggests a decreasing bandgap. Further, ZnSO 4 forms at substrate interfaces, which may be detrimental for device performance.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: ZnO doping and properties · Semiconductor materials and devices · Electronic and Structural Properties of Oxides

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, United States

Department of Mechanical and Industrial Engineering, Norwegian University of Science and Technology, Trondheim 7491, Norway

Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, United States

Funding

Austrian Science Fund · Stanford University

References (21)

Show source-provided references
1. 10.1002/pip.276410.1002/pip.2764 ↗
2. 10.1063/1.478985510.1063/1.4789855 ↗
3. 10.1063/1.222206710.1063/1.2222067 ↗
4. 10.4229/28thEUPVSEC2013-3BO.7.510.4229/28thEUPVSEC2013-3BO.7.5 ↗
5. 10.1016/j.solmat.2016.01.04310.1016/j.solmat.2016.01.043 ↗
6. 10.1038/srep0177510.1038/srep01775 ↗
7. 10.1021/acs.jpclett.6b0039310.1021/acs.jpclett.6b00393 ↗
8. 10.1021/acs.nanolett.5b0237310.1021/acs.nanolett.5b02373 ↗
9. 10.1039/C5TC02912K10.1039/C5TC02912K ↗
10. 10.1021/acsami.6b0400010.1021/acsami.6b04000 ↗
11. 10.1038/srep1686310.1038/srep16863 ↗
12. 10.1021/acs.chemmater.5b0422310.1021/acs.chemmater.5b04223 ↗
13. 10.1002/aenm.20110024610.1002/aenm.201100246 ↗
14. 10.1063/1.173707510.1063/1.1737075 ↗
15. 10.1063/1.363177410.1063/1.3631774 ↗
16. 10.1103/PhysRevB.66.24520510.1103/PhysRevB.66.245205 ↗
17. 10.1021/jp412000j10.1021/jp412000j ↗
18. 10.1080/0015019940821602110.1080/00150199408216021 ↗
19. 10.1063/1.44750910.1063/1.447509 ↗
20. 10.1021/jp507304410.1021/jp5073044 ↗
21. 10.1016/j.triboint.2010.10.01810.1016/j.triboint.2010.10.018 ↗