journal article·2020-05-27

Reversible Transformation between Bipolar Memory Switching and Bidirectional Threshold Switching in 2D Layered K-Birnessite Nanosheets

Meilin Tu, Haipeng Lu, Songwen Luo, Hao Peng, Shangdong Li, Yizhen Ke, Shuoguo Yuan, Wen Huang, Wenjing Jie, Jianhua Hao

ACS Applied Materials & Interfaces· Volume 12· Issue 21
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Abstract

Birnessite-related manganese dioxides (MnO2) have recently been studied owing to their diverse low-dimensional layered structures and potential applications in energy devices. The birnessite MnO2 possesses a layered structure with edge-shared MnO6 octahedra layer stacked with interlayer of cations. The unique layered structure may provide some distinct electrical properties for the 2D layered nanosheets. In this work, layered K-birnessite MnO2 samples are synthesized by a hydrothermal method. The resistive switching (RS) devices based on single K-birnessite MnO2 nanosheets are fabricated by transferring the nanosheets onto SiO2/Si substrates through a facile and feasible method of mechanical exfoliation. The device exhibits nonvolatile memory switching (MS) behaviors with high current ON/OFF ratio of ∼2 × 105. And more importantly, reversible transformation between the nonvolatile MS and volatile threshold switching (TS) can be achieved in the single layered nanosheet through tuning the magnitude of compliance current (Icc). To be more specific, a relatively high Icc (1 mA) can trigger the nonvolatile MS behaviors, while a relatively low Icc (≤100 μA) can generate volatile TS characteristics. This work not only demonstrates the memristor based on single birnessite-related MnO2 nanosheet, but also offers an insight into understanding the complex resistive switching types and relevant physical mechanisms of the 2D layered oxide nanosheets.
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Research context

OpenAlex topics: Advanced Memory and Neural Computing · Gas Sensing Nanomaterials and Sensors · Transition Metal Oxide Nanomaterials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

College of Chemistry and Materials Science, Sichuan Normal University, Chengdu 610066, China

National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu 610054, China

State Key Laboratory of Electronic Thin Films and Integrated Devices, School of electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China

Department of Applied Physics, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong China

Funding

National Key Laboratory of Electronic Thin Films and Integrated Devices · Research Grants Council, University Grants Committee · Sichuan Youth Science and Technology Foundation · National Natural Science Foundation of China · Sichuan Province · National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China

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