Impact of Interface Mixing on the Performance of Solution Processed Organic Light Emitting Diodes—Impedance and Ultraviolet Photoelectron Spectroscopy Study
Source abstract
Abstract
We investigated interfacial mixing of solution-processed organic light-emitting devices (OLEDs) using impedance spectroscopy (IS) and ultraviolet photoelectron spectroscopy (UPS) and its impact on device performance. We focused on interfacial mixing between a solution-processed cross-linkable hole transport layer (XM) and an emitting layer (EML), formed either by solution processing or vacuum evaporation. The results of IS and UPS clearly indicated that extensive interfacial mixing was unavoidable, even after the XM was cross-linked to make it insoluble and rinsed to remove residual soluble species, if the subsequent EML was solution processed. In addition, we also demonstrated that interfacial mixing indeed increased hole current density in corresponding hole only device (HOD). In fact, the hole injection efficiency could be an order of magnitude better when the EML was solution processed rather than vacuum evaporated. We investigated such behavior to find the desirable process condition of solution-processed OLEDs.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Organic Light-Emitting Diodes Research · Organic Electronics and Photovoltaics · Thin-Film Transistor Technologies
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Organic Electronic Materials Laboratory, Department of Information Display, Kyung Hee University, Seoul 02447, Republic of Korea
Department of Physics and Institute of Basic Sciences, Kyung Hee University, Seoul 02447, Republic of Korea
Platform Technology Lab, Samsung Advanced Institute of Technology, 130 Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do 16678, Korea
Funding
Ministry of Trade, Industry and Energy · Korea Display Research Corporation
References (36)
Show source-provided references
1. 10.1063/1.9879910.1063/1.98799 ↗
2. 10.1109/JDT.2007.89535710.1109/JDT.2007.895357 ↗
3. 10.1038/1639310.1038/16393 ↗
4. 10.1002/adma.20040068410.1002/adma.200400684 ↗
5. 10.1021/cm102405210.1021/cm1024052 ↗
6. 10.1080/15980316.2008.965205210.1080/15980316.2008.9652052 ↗
7. 10.1021/cm101937p10.1021/cm101937p ↗
8. 10.1039/b926348a10.1039/b926348a ↗
9. 10.1063/1.289084510.1063/1.2890845 ↗
10. 10.1016/j.orgel.2010.05.01510.1016/j.orgel.2010.05.015 ↗
11. 10.1063/1.295248310.1063/1.2952483 ↗
12. 10.1021/cm102401k10.1021/cm102401k ↗
13. 10.1002/adma.20120451810.1002/adma.201204518 ↗
14. 10.1021/cm034650o10.1021/cm034650o ↗
15. 10.1038/nphoton.2013.7010.1038/nphoton.2013.70 ↗
16. 10.1039/b907991m10.1039/b907991m ↗
17. 10.1117/12.222729210.1117/12.2227292 ↗
18. 10.1002/adma.20110115410.1002/adma.201101154 ↗
19. 10.1889/1.362148810.1889/1.3621488 ↗
20. 10.1002/adfm.20060065110.1002/adfm.200600651 ↗
21. 10.1002/adfm.20140195810.1002/adfm.201401958 ↗
22. 10.1021/jp203674p10.1021/jp203674p ↗
23. 10.1088/0022-3727/46/5/05510210.1088/0022-3727/46/5/055102 ↗
24. 10.1063/1.492182910.1063/1.4921829 ↗
25. 10.1063/1.293608410.1063/1.2936084 ↗
26. 10.1063/1.329464210.1063/1.3294642 ↗
27. Nowy S. · 2010
28. 10.1039/c2jm14347j10.1039/c2jm14347j ↗
29. 10.1016/j.apsusc.2016.04.14010.1016/j.apsusc.2016.04.140 ↗
30. 10.1002/sia.367510.1002/sia.3675 ↗
31. 10.1116/1.333624210.1116/1.3336242 ↗
32. 10.1016/S0927-796X(01)00034-110.1016/S0927-796X(01)00034-1 ↗
33. 10.1149/2.011207jes10.1149/2.011207jes ↗
34. 10.1063/1.289401310.1063/1.2894013 ↗
35. 10.1063/1.278789010.1063/1.2787890 ↗
36. 10.1080/15421406.2016.120138510.1080/15421406.2016.1201385 ↗