Fabrication, electrical and dielectric characterization of Cd-Ni nanoferrites

Abstract A series of Cd2+ doped Ni ferrites, with the formula Ni1-xCdxFe2O4 where x = 0.0, 0.2, 0.4, 0.6, have been fabricated by the co-precipitation technique. The structural characterization of the samples has been completed by X-ray diffraction at room temperature. The average crystallite size lies in the range 21 to 28 nm. The lattice constant changes with the variation of Cd2+, and lies between 8.351 to 8.595 A. The dc electrical resistivity is measured as a function of temperature from 300 K to 700 K. The diminishing in dc electrical resistivity as a function of temperature affirms the semiconductor like nature. The dielectric properties of these materials as a function of frequency in the range of 20 Hz to 3 MHz demonstrated the diminishing pattern of dielectric constant (ἑ), dielectric loss factor (tan δ) for all the samples. The dielectric properties can be explained by Maxwell-Wagner two layer models and the Koop's phenomenological hypothesis.