journal article·2019-05-15Open access

Hybrid Machine Learning Method to Determine the Optimal Operating Process Window in Aerosol Jet 3D Printing

Haining Zhang, Seung Ki Moon, Teck Hui Ngo

ACS Applied Materials & Interfaces· Volume 11· Issue 19

Abstract

Aerosol jet printing (AJP) is a three-dimensional (3D) noncontact and direct printing technology for fabricating customized microelectronic devices on flexible substrates. Despite the capability of fine feature deposition, the complicated relationship between the main process parameters will affect the printing quality significantly in a design space. In this paper, a novel hybrid machine learning method is proposed to determine the optimal operating process window for the AJP process in various design spaces. The proposed method consists of classic machine learning methods, including experimental sampling, data clustering, classification, and knowledge transfer. In the proposed method, a two-dimensional design space is fully explored by a Latin hypercube sampling experimental design at a certain print speed. Then, the influence of the sheath gas flow rate (SHGFR) and the carrier gas flow rate (CGFR) on the printed line quality is analyzed by a K-means clustering approach, and an optimal operating process window is determined by a support vector machine. To efficiently identify more operating process windows at different print speeds, a transfer learning approach is applied to exploit relatedness between different operating process windows. Hence, at a new print speed, the number of line samples for identifying a new operating process window is greatly reduced. Finally, to balance the complex relationship among SHGFR, CGFR, and print speed, a 3D operating process window is determined by an incremental classification approach. Different from experiment-based approaches adopted in 3D printing technologies for quality optimization, the proposed method is developed based on the theory of knowledge discovery and data mining. Therefore, the knowledge in different design spaces can be fully explored and transferred for printed line quality optimization. Moreover, the data-driven-based characteristics can help the proposed method develop a guideline for quality optimization in other 3D printing technologies.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: Nanomaterials and Printing Technologies · Infection Control and Ventilation · Particle Dynamics in Fluid Flows

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Mechanical and Aerospace Engineering, Nanyang Technological University, Singapore 639798

SMRT Corporation Ltd, Singapore, Singapore 579828

Funding

National Research Foundation Singapore · SMRT-NTU Smart Urban Rail Corporate Laboratory

References (45)

Show source-provided references
1. 10.1021/acsami.7b0680410.1021/acsami.7b06804 ↗
2. 10.1021/acsami.7b0257310.1021/acsami.7b02573 ↗
3. 10.1146/annurev-matsci-070115-03163210.1146/annurev-matsci-070115-031632 ↗
4. 10.1021/nn505979j10.1021/nn505979j ↗
5. 10.1002/adma.20160077210.1002/adma.201600772 ↗
6. 10.1038/srep1595910.1038/srep15959 ↗
7. 10.1021/acsami.6b0683810.1021/acsami.6b06838 ↗
8. 10.1002/smll.20130300010.1002/smll.201303000 ↗
9. 10.1007/s11664-013-2893-410.1007/s11664-013-2893-4 ↗
10. 10.1021/ie503636c10.1021/ie503636c ↗
11. 10.1016/j.jelechem.2011.12.00510.1016/j.jelechem.2011.12.005 ↗
12. 10.1002/adfm.20110207510.1002/adfm.201102075 ↗
13. 10.1021/am504171u10.1021/am504171u ↗
14. 10.1021/am401200y10.1021/am401200y ↗
15. 10.1002/adfm.20090184510.1002/adfm.200901845 ↗
16. 10.1039/C1JM14773K10.1039/C1JM14773K ↗
17. 10.1016/j.egypro.2011.06.18410.1016/j.egypro.2011.06.184 ↗
18. 10.1016/j.solmat.2012.06.04210.1016/j.solmat.2012.06.042 ↗
19. 10.1021/acsami.8b0145610.1021/acsami.8b01456 ↗
20. 10.1021/am200907k10.1021/am200907k ↗
21. 10.1021/am400606y10.1021/am400606y ↗
22. 10.1115/1.403666010.1115/1.4036660 ↗
23. 10.1115/1.403459110.1115/1.4034591 ↗
24. 10.1088/2058-8585/aa5af910.1088/2058-8585/aa5af9 ↗
25. 10.1016/j.orgel.2015.03.03410.1016/j.orgel.2015.03.034 ↗
26. Verheecke, W.; Van Dyck, M.; Vogeler, F.; Voet, A.; Valkenaers, H. In Proceedings of the 8th International DAAAM Baltic Conference on Mechatronics and System Engineering; Conference Permanent Committee, Ed. Tallinn University of Technology: Tallinn, Estonia, April 19–21, 2012.
27. Wang, K.; Chang, Y. H.; Zhang, C.; Wang, B. In Proceedings of the SAMPE Fall Technical Conference on Advancement of Material and Process Engineering, Wichita; Conference Permanent Committee, Ed. SAMPE: Covina, Oct 21–24, 2013.
28. Goth, C.; Putzo, S.; Franke, J. In Proceedings of the 61st Electronic Components and Technology Conference, Florida; Conference Permanent Committee, Ed. IEEE: Washington, 31 May–3 June, 2011.
29. Christenson, K. K.; Paulsen, J. A.; Renn, M. J.; McDonald, K.; Bourassa, J. In Proceedings of the NIP & Digital Fabrication Conference on Digital Fabrication Printed Electronics, Minneapolis; Conference Permanent Committee, Ed. Society for Imaging Science and Technology, October 2–6, 2011.
30. Hedges, M.; Marin, A. B. In Proceedings of the DDMC 2012 Conference on Printed Electronics, Berlin, Germany [CD-ROM]; Fraunhofer: Aachen, March 15–16, 2012.
31. 10.1080/00401706.2000.1048604510.1080/00401706.2000.10486045 ↗
32. 10.1080/00401706.1979.1048975510.1080/00401706.1979.10489755 ↗
33. 10.1029/2005WR00430310.1029/2005WR004303 ↗
34. 10.2307/234683010.2307/2346830 ↗
35. 10.1016/j.patrec.2009.09.01110.1016/j.patrec.2009.09.011 ↗
36. 10.1007/s10845-009-0254-110.1007/s10845-009-0254-1 ↗
37. 10.1007/s00170-017-0165-910.1007/s00170-017-0165-9 ↗
38. 10.1007/s00170-017-0396-910.1007/s00170-017-0396-9 ↗
39. 10.1016/j.ijmachtools.2004.04.00310.1016/j.ijmachtools.2004.04.003 ↗
40. 10.1631/jzus.2005.A043310.1631/jzus.2005.A0433 ↗
41. 10.1109/TKDE.2009.19110.1109/TKDE.2009.191 ↗
42. 10.1186/s40537-016-0043-610.1186/s40537-016-0043-6 ↗
43. Dai, W.; Yang, Q.; Xue, G. R.; Yu, Y. In Proceedings of the 24th International Conference on Machine learning, Corvallis; ACM: New York, June 20–24, 2007.
44. Yao, Y.; Doretto, G. In Proceedings of the 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Conference, San Francisco; IEEE, June 13–18, 2010.
45. Ben-David, S.; Schuller, R. In Proceedings of 16th Annual Conference on Learning Theory and Kernel Machines, Washington, DC; Schölkopf, B., Warmuth, M. K.; Springer: Germany, August 24–27, 2003.