Near-Field Infrared Sum-Frequency Generation Imaging of Chemical Vapor Deposited Zinc Selenide
Source abstract
Abstract
Infrared sum-frequency generation (SFG) has been detected with near-field scanning optical microscopy (NSOM) for the first time. SFG NSOM images of a chemical vapor deposited (CVD) disk of zinc selenide were recorded as a function of infrared (IR) wavelengths ranging from 3.1 to 4.4 μm from an amplified femtosecond laser. Striation patterns, which are not observed in the topography, were detected in the optical images and exhibited increased SFG in comparison to homogeneous regions of the semiconductor. SFG images were demonstrated to have ∼ λ/20 spatial resolution in comparison to the IR wavelengths used to produce the sum frequency.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Near-Field Optical Microscopy · Integrated Circuits and Semiconductor Failure Analysis · Advanced Fluorescence Microscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Chemistry, University of California, Berkeley, California 94720-1460
References (32)
Show source-provided references
1. Shen Y. R. · 1984
2. Bloembergen N. · Appl. Phys. B · 1999 · 68 · 28910.1007/s003400050621 ↗
3. Shen Y. R. · Nature · 1989 · 337 · 2410.1038/337024a0 ↗
4. Boyd R. · 1992
5. McGilp J. F. · J. Phys. D · 1996 · 29 · 181210.1088/0022-3727/29/7/016 ↗
6. Florsheimer M. · Langmuir · 1999 · 15 · 543710.1021/la9815603 ↗
7. Vigoureux J. M. · J. Mod. Opt. · 1994 · 41 · 4910.1080/09500349414550071 ↗
8. Zhao X. · Ultramicroscopy · 1995 · 61 · 6910.1016/0304-3991(95)00110-7 ↗
9. Smolyaninov I. I. · Opt. Lett. · 1997 · 22 · 159210.1364/OL.22.001592 ↗
10. Smolyaninov I. I. · Appl. Phys. Lett. · 1999 · 74 · 194210.1063/1.123735 ↗
11. Sanchez E. J. · Phys. Rev. Lett. · 1999 · 82 · 401410.1103/PhysRevLett.82.4014 ↗
12. Bozhevolnyi S. I. · Opt. Commun. · 1998 · 150 · 4910.1016/S0030-4018(98)00014-5 ↗
13. Jenei A. · Biophys. J. · 1999 · 76 · 109210.1016/S0006-3495(99)77274-7 ↗
14. Kirsch A. K. · Biophys. J. · 1998 · 75 · 151310.1016/S0006-3495(98)74070-6 ↗
15. Schaller R. D. · J. Phys. Chem. B · 2000 · 104 · 521710.1021/jp000276t ↗
16. Bozhevolnyi S. I. · J. Opt. Soc. Am. A · 1998 · 15 · 215610.1364/JOSAA.15.002156 ↗
17. Smolyaninov I. I. · Phys. Rev. B · 1997 · 56 · 929010.1103/PhysRevB.56.9290 ↗
18. Jakubczyk D. · Opt. Lett. · 1999 · 24 · 115110.1364/OL.24.001151 ↗
19. Schaller R. D. · J. Anal. Chem. · 2000 · 72 · 536110.1021/ac000699r ↗
20. Dragnea B. · J. Appl. Phys. · 1999 · 86 · 279510.1063/1.371127 ↗
21. Knoll B. · Nature · 1999 · 399 · 13410.1038/20154 ↗
22. Hong M. K. · Nucl. Instrum. Methods Phys. Res. B · 1998 · 144 · 24610.1016/S0168-583X(98)00311-5 ↗
23. Piednoir A. · Opt. Commun. · 1996 · 129 · 41410.1016/S0030-4018(96)00174-5 ↗
24. Paesler M. A. · 1996
25. Okuyama H. · Appl. Phys. Lett. · 1995 · 66 · 65610.1063/1.114120 ↗
26. Park R. M. · Proc. SPIEInt. Soc. Opt. Eng. · 1995 · 2524 · 142
27. Allen J. W. · Semicond. Sci. Technol. · 1995 · 10 · 104910.1088/0268-1242/10/8/002 ↗
28. Queisser H. J. · Science · 1998 · 281 · 94510.1126/science.281.5379.945 ↗
29. Hocker L. O. · Appl. Phys. Lett. · 1976 · 28 · 26710.1063/1.88722 ↗
30. Yamada C. · Phys. Rev. B · 1994 · 49 · 1437210.1103/PhysRevB.49.14372 ↗
31. Schade W. · Opt. Commun. · 1998 · 150 · 2710.1016/S0030-4018(98)00031-5 ↗
32. Peng W. J. · QELS · 1996 · 10 · 55