Investigation on the Effect of Accumulated Charge-Induced Degradation on Multilayer Photovoltaic Insulating Backsheets Based on Atomic Force Microscopy
Abstract
Research context
OpenAlex topics: High voltage insulation and dielectric phenomena · Electrical Fault Detection and Protection · Photovoltaic System Optimization Techniques
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Affiliations
School of Electrical Engineering, Xi’an University of Technology, Xi’an, Shanxi 710048, China
State Grid Jilin Electric Power Company Tonghua City Power Supply Company, Tonghua, Jilin 134001, China
School of Materials Science and Engineering, Shandong University of Science and Technology, 579 Qianwangang Road, Qingdao, Shandong 266590, China
Materials Physics Laboratory, Department of Physics, Faculty of Science, Prince of Songkla University (PSU), Songkhla 90112, Thailand
Computer Science and Engineering Department, University of Connecticut, Storrs, Connecticut 06268, United States
Funding
Xi'an University of Technology · National Natural Science Foundation of China · State Key Laboratory of Reliability and Intelligence Electrical Equipment, Hebei University of Technology · State Key Laboratory of Engineering Dielectrics and Its Application