Electron-Beam-Induced Current Measurements of Thin-Film Solar Cells
Source abstract
Abstract
The present tutorial review provides a practical guide to the analysis of semiconductor devices using electron-beam-induced currents (EBICs). The authors focus on cross-sectional EBIC measurements that provide an experimental assay of the efficiency of charge carrier collection in a semiconductor diode. The tutorial covers the fundamental physics of the technique, specimen preparation, data acquisition, and numerical simulation and analysis of the experimental data. A key focus is put on application cases from the field of thin-film photovoltaics as well as specific pitfalls that may occur, such as effects occurring under high-level injection and at grain boundaries of polycrystalline materials.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Chalcogenide Semiconductor Thin Films · Silicon and Solar Cell Technologies · Quantum Dots Synthesis And Properties
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, Germany
IEK5-Photovoltaik, Forschungszentrum Jülich, 52425 Jülich, Germany
Faculty of Engineering and CENIDE, University of Duisburg-Essen, Carl-Benz-Strasse 199, 47057 Duisburg, Germany
Funding
Bundesministerium f??r Wirtschaft und Technologie · Helmholtz-Gemeinschaft
References (59)
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