Surface Engineering of Ti–Pt Bottom Electrodes for Precise Texture Control of PZT Thin Films on Si
Source abstract
Abstract
Growing ferroelectric films with different textures under identical process conditions poses a significant materials challenge. The texture of the ferroelectric films is largely influenced by the underlying substrate. Ti/Pt deposited on silicon is widely used as a bottom electrode and substrate for the growth of PZT thin films. In this study, we developed a novel two-step deposition process to engineer the surface of the Ti/Pt bottom electrode, enabling the growth of distinct (100) and (111) textured PZT thin films on different regions of the same silicon wafer. Using photolithography, we successfully sputter-deposited monolayer and bilayer Ti/Pt on separate regions of the wafer, allowing for controlled texture formation under identical processing conditions. We found that the bilayer Ti/Pt bottom electrode effectively suppressed Ti diffusion and oxide formation, critical factors for achieving (100) textured PZT growth. In contrast, the monolayer Ti/Pt exhibited Ti diffusion and oxide formation, leading to the growth of (111) textured PZT. Ferroelectric and piezoelectric measurements showed that (100) textured films exhibited enhanced piezoelectric and dielectric properties, ( d 33,f(100) = 115 pm/V, d 33,f(111) = 36 pm/V). These findings highlight the potential of surface-engineered Ti/Pt electrodes in optimizing PZT thin films for piezoelectric MEMS applications.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Ferroelectric and Piezoelectric Materials · Advanced Sensor and Energy Harvesting Materials · Dielectric materials and actuators
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Centre for Nano Science and Engineering
Indian Institute of Science
Funding
Department of Science and Technology, Ministry of Science and Technology, India
References (37)
Show source-provided references
1. Okada A. · J. Appl. Phys. · 1978 · 49 · 449410.1063/1.325455 ↗
2. 10.1109/58.415310.1109/58.4153 ↗
3. Budd K. · 1985 · 107
4. 10.1111/j.1151-2916.1999.tb01840.x10.1111/j.1151-2916.1999.tb01840.x ↗
5. Jaffe B. · 1971
6. 10.1109/58.85207310.1109/58.852073 ↗
7. 10.1109/JSEN.2019.293646910.1109/JSEN.2019.2936469 ↗
8. 10.1109/JMEMS.2021.309165110.1109/JMEMS.2021.3091651 ↗
9. Roy K. · 2022 · 11960 · 282
10. Dangi A. · IEEE Sens. · 2018 · 1
11. Dangi A. · 2020 · 11240 · 317
12. 10.1063/1.12137310.1063/1.121373 ↗
13. 10.1063/1.12611310.1063/1.126113 ↗
14. Morgan Electroceramics · 2004
15. 10.1063/1.218561410.1063/1.2185614 ↗
16. 10.1143/JJAP.40.71310.1143/JJAP.40.713 ↗
17. Cheng J. · 2000 · 2 · 930
18. 10.1063/1.36661410.1063/1.366614 ↗
19. 10.1016/j.mtla.2019.10022810.1016/j.mtla.2019.100228 ↗
20. 10.5185/amlett.2011.728110.5185/amlett.2011.7281 ↗
21. 10.1063/1.361984110.1063/1.3619841 ↗
22. 10.1103/PhysRevB.82.09411410.1103/PhysRevB.82.094114 ↗
23. 10.1016/j.actamat.2004.02.02510.1016/j.actamat.2004.02.025 ↗
24. 10.1021/acsami.6b0947010.1021/acsami.6b09470 ↗
25. 10.1016/j.matchemphys.2015.06.01810.1016/j.matchemphys.2015.06.018 ↗
26. 10.1016/j.susc.2004.08.00610.1016/j.susc.2004.08.006 ↗
27. 10.1016/0039-6028(85)90439-X10.1016/0039-6028(85)90439-X ↗
28. 10.1063/1.35588910.1063/1.355889 ↗
29. 10.1016/0038-1098(77)91186-310.1016/0038-1098(77)91186-3 ↗
30. 10.1143/JJAP.34.515410.1143/JJAP.34.5154 ↗
31. 10.1016/0254-0584(96)80095-210.1016/0254-0584(96)80095-2 ↗
32. 10.1016/S0025-5408(00)00354-810.1016/S0025-5408(00)00354-8 ↗
33. 10.1063/1.37111410.1063/1.371114 ↗
34. 10.1016/j.ceramint.2022.05.03910.1016/j.ceramint.2022.05.039 ↗
35. 10.1143/JJAP.36.558010.1143/JJAP.36.5580 ↗
36. 10.1557/JMR.1997.007610.1557/JMR.1997.0076 ↗
37. 10.1016/B978-012480874-4/50022-110.1016/B978-012480874-4/50022-1 ↗