journal article·2025-03-11

Plastic Inorganic van der Waals Semiconductors for Flexible X-ray Detectors

Qiao Wang, Chengliang Wan, You Wu, Xuhong Fan, Shuai Wang, Yuzhou Pan, Mansoor Khalid, Haiying Xiao, Hongqiang Zhang, Guoliang Ma, Yongqing Fu, Ping-An Hu

Publisher page

Abstract

Radiation detectors that are low-cost, portable, and operating at ambient temperature are highly desirable, especially if they are combined with flexibility and miniaturization. Plastic inorganic semiconductors, distinguished by their excellent electrical and mechanical properties, are promising candidates for portable and wearable radiation detectors. Herein, we demonstrate the potential of plastic inorganic van der Waals single crystals as flexible solid-state radiation detectors operating at room temperature. This study discovers that van der Waals materials such as gallium telluride (GaTe) show high plasticity as well as remarkable radiation detection characteristics, including high absorption coefficient and large mobility–lifetime ( μτ ) product (∼2 × 10 –3 cm 2 V –1 ), which make them high-quality materials for constructing flexible X-ray detectors. The GaTe-based X-ray detector with asymmetric metal electrodes achieved an extremely low electric field of 1 × 10 –4 V μm –1, and the detection sensitivity is as high as 40980 μC Gy air –1 cm –2 . The device performance was unaffected by its bending status, showing superior stability during prolonged exposure to continuous γ-ray radiation (total dose: 5000 Gy). Our research should be easily generalizable to other van der Waals semiconductors for fabricating flexible radiation sensors that can be embedded in curved or deformable systems.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: 2D Materials and Applications · Advanced Thermoelectric Materials and Devices · Advanced Semiconductor Detectors and Materials

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Chemistry and Chemical Engineering

Harbin Institute of Technology

Key Laboratory of Micro-systems and Micro-structures, Manufacturing of Ministry of Education

School of Nuclear Science and Technology

Lanzhou University

School of Materials Science and Engineering

Research Center of Basic Space Science

The Faculty of Engineering and Environment

Northumbria University

Funding

National Key Research and Development Program of China · State Key Laboratory of Robotics and System · National Natural Science Foundation of China

References (74)

Show source-provided references
1. 10.1088/1361-6633/80/2/02630110.1088/1361-6633/80/2/026301 ↗
2. 10.1038/nphoton.2016.13910.1038/nphoton.2016.139 ↗
3. 10.1038/nmat492710.1038/nmat4927 ↗
4. Phlips, B. F.; Johnson, W. N.; Kroeger, R. A.; Kurfess, J. D.Development of Thick Intrinsic Silicon Detectors for Hard X-Ray and Gamma-Ray Detection. In IEEE Nuclear Science Symposium and Medical Imaging Conference; IEEE, 2001; pp 207–211 10.1109/nssmic.2001.1008442.10.1109/nssmic.2001.1008442 ↗
5. 10.1016/j.nima.2004.05.07110.1016/j.nima.2004.05.071 ↗
6. 10.1016/j.nima.2006.11.02310.1016/j.nima.2006.11.023 ↗
7. 10.1039/C8EE03559H10.1039/C8EE03559H ↗
8. 10.1080/00223131.2019.158111110.1080/00223131.2019.1581111 ↗
9. 10.1038/s41586-023-06811-010.1038/s41586-023-06811-0 ↗
10. 10.1038/s41586-021-03488-110.1038/s41586-021-03488-1 ↗
11. 10.1038/s41467-022-35229-x10.1038/s41467-022-35229-x ↗
12. 10.1038/s41586-018-0008-310.1038/s41586-018-0008-3 ↗
13. 10.1038/s41563-018-0047-z10.1038/s41563-018-0047-z ↗
14. 10.1126/science.aba977810.1126/science.aba9778 ↗
15. 10.1038/s41928-022-00746-610.1038/s41928-022-00746-6 ↗
16. 10.1002/adma.20200768110.1002/adma.202007681 ↗
17. 10.1126/science.abq068210.1126/science.abq0682 ↗
18. 10.1002/adfm.20180258110.1002/adfm.201802581 ↗
19. Hayes, T. C. Growth, Characterization, and Surface Modifications of Gallium Telluride for Radiation Detection; University of South Carolina, 2012.
20. 10.1103/PhysRevB.84.16520610.1103/PhysRevB.84.165206 ↗
21. 10.1002/adfm.20220592310.1002/adfm.202205923 ↗
22. 10.1016/B978-012544415-6.50114-X10.1016/B978-012544415-6.50114-X ↗
23. 10.1103/PhysRevB.107.07542910.1103/PhysRevB.107.075429 ↗
24. 10.1016/j.cplett.2018.10.02010.1016/j.cplett.2018.10.020 ↗
25. 10.1021/nn405403910.1021/nn4054039 ↗
26. 10.1038/nphoton.2013.24110.1038/nphoton.2013.241 ↗
27. 10.1038/nnano.2013.10010.1038/nnano.2013.100 ↗
28. 10.1039/d3tc01958f10.1039/d3tc01958f ↗
29. 10.1021/acsphotonics.8b0106610.1021/acsphotonics.8b01066 ↗
30. Reshmi, P. M.; Kunjomana, A. G.; Chandrasekharan, K. A.; Meena, M.; Mahadevan, C. K. Structural, Electrical and Mechanical Properties of GaTe for Radiation Detector Applications. 2011, 5, 228–232.
31. Conway, A. M.; Reinhardt, C. E.; Nikolić, R. J.; Nelson, A. J.; Wang, T. F.; Wu, K. J.; Payne, S. A.; Mertiri, A.; Pabst, G.; Roy, R.; Mandal, K. C.; Bhattacharya, P.; Cui, Y.; Groza, M.; Burger, A. Exploration of GaTe for Gamma Detection. In IEEE Nuclear Science Symposium Conference Record; IEEE, 2007; pp 1551–1555 10.1109/NSSMIC.2007.4437294.10.1109/NSSMIC.2007.4437294 ↗
32. 10.1063/1.317647810.1063/1.3176478 ↗
33. Mandal, K. C.; Hayes, T.; Muzykov, P. G.; Krishna, R.; Das, S.; Sudarshan, T. S.; Ma, S.Characterization of Gallium Telluride Crystals Grown from Graphite Crucible. In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII 2010; p 78050Q 10.1117/12.863570.10.1117/12.863570 ↗
34. 10.1016/j.mattod.2024.08.02910.1016/j.mattod.2024.08.029 ↗
35. 10.1038/s41467-023-42818-x10.1038/s41467-023-42818-x ↗
36. 10.1002/adfm.20190101210.1002/adfm.201901012 ↗
37. 10.1016/j.cej.2022.13644610.1016/j.cej.2022.136446 ↗
38. 10.1002/advs.20220343610.1002/advs.202203436 ↗
39. 10.1002/adma.20150540910.1002/adma.201505409 ↗
40. 10.1021/acs.jpclett.9b0161110.1021/acs.jpclett.9b01611 ↗
41. 10.1016/j.ymssp.2022.10981810.1016/j.ymssp.2022.109818 ↗
42. 10.1126/science.aar603510.1126/science.aar6035 ↗
43. 10.1002/advs.20220377610.1002/advs.202203776 ↗
44. 10.1002/adfm.20230604210.1002/adfm.202306042 ↗
45. 10.1002/aenm.20210088310.1002/aenm.202100883 ↗
46. 10.1149/1.240347110.1149/1.2403471 ↗
47. 10.1016/S0022-0248(03)01552-510.1016/S0022-0248(03)01552-5 ↗
48. 10.1038/s41563-023-01788-710.1038/s41563-023-01788-7 ↗
49. 10.1038/nphoton.2016.4110.1038/nphoton.2016.41 ↗
50. 10.3390/s13101374410.3390/s131013744 ↗
51. 10.3390/s11050511210.3390/s110505112 ↗
52. 10.1038/nphoton.2015.8210.1038/nphoton.2015.82 ↗
53. 10.1109/TNS.2011.217594810.1109/TNS.2011.2175948 ↗
54. 10.1016/S0168-9002(03)00745-910.1016/S0168-9002(03)00745-9 ↗
55. 10.1038/s41928-021-00683-w10.1038/s41928-021-00683-w ↗
56. 10.1038/s41565-023-01579-w10.1038/s41565-023-01579-w ↗
57. 10.1088/0953-8984/21/1/01550410.1088/0953-8984/21/1/015504 ↗
58. 10.1038/s41467-019-08981-w10.1038/s41467-019-08981-w ↗
59. 10.1016/j.mattod.2020.02.02210.1016/j.mattod.2020.02.022 ↗
60. 10.1088/0031-9155/28/11/00610.1088/0031-9155/28/11/006 ↗
61. 10.1088/1748-0221/7/10/C1000410.1088/1748-0221/7/10/C10004 ↗
62. 10.1088/0022-3727/33/21/32610.1088/0022-3727/33/21/326 ↗
63. 10.1118/1.367395710.1118/1.3673957 ↗
64. 10.1002/pssc.20030625810.1002/pssc.200306258 ↗
65. 10.1088/1748-0221/8/02/C0202810.1088/1748-0221/8/02/C02028 ↗
66. Zentai, G.; Partain, L. D.; Pavlyuchkova, R.; Proano, C.; Virshup, G. F.; Melekhov, L.; Zuck, A.; Breen, B. N.; Dagan, O.; Vilensky, A.; Schieber, M.; Gilboa, H.; Bennet, P.; Shah, K. S.; Dmitriyev, Y. N.; Thomas, J. A.; Yaffe, M. J.; Hunter, D. M.Mercuric Iodide and Lead Iodide X-Ray Detectors for Radiographic and Fluoroscopic Medical Imaging. In Medical Imaging 2003: Physics of Medical Imaging; SPIE, 2003; p 77 10.1117/12.480227.10.1117/12.480227 ↗
67. 10.1063/1.499975910.1063/1.4999759 ↗
68. 10.1109/23.68243310.1109/23.682433 ↗
69. 10.1038/nature2403210.1038/nature24032 ↗
70. 10.1038/nphoton.2017.4310.1038/nphoton.2017.43 ↗
71. 10.1038/s41566-017-0012-410.1038/s41566-017-0012-4 ↗
72. Lacoe, R. C.; Osborn, J. V.; Mayer, D. C.; Witczak, S. C.; Brown, S.; Robertson, R.; Hunt, D. R.Total-Dose Tolerance of a Chartered Semiconductor 0.35-Mm CMOS Process. In IEEE Radiation Effects Data Workshop; IEEE, 1999; pp 82–86 10.1109/redw.1999.816059.10.1109/redw.1999.816059 ↗
73. 10.3390/ma1102018610.3390/ma11020186 ↗
74. 10.1088/2053-1583/aaa6eb10.1088/2053-1583/aaa6eb ↗