Effect of Bi Additive on the Physical Properties of Ge2Se3-Based Equichalcogenide Glasses and Thin Films
Source abstract
Abstract
The influence of Bi on the structure and physical properties of Ge 2 Se 3 -based equichalcogenide glasses and thin films is studied. Thermal analysis shows increased crystallization ability for Bi-modified glasses. Direct current (DC) and alternating current (AC) electrical conductivity for bulk glasses and thin films is investigated in a broad range of temperatures and frequencies, showing a strong dependence on the presence of Bi modifiers. Exposure wavelength dependence of photocurrent is studied at different temperatures for the visible range of spectrum, and correlated with the existence of localized states in the mobility gap of these amorphous semiconductors. Structural peculiarities of the obtained thin films and bulk samples are assessed from X-ray diffraction (XRD) and high-resolution X-ray photoelectron spectroscopy (XPS) measurements. Optical, electrical, and thermal properties are shown to be suitable for various applications in photonics, electronics, and sensor systems.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Phase-change materials and chalcogenides · Glass properties and applications · Chalcogenide Semiconductor Thin Films
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Physics, Engineering and Astronomy, Austin Peay State University, Clarksville, Tennessee 37044, United States
Faculty of Physics, Opole University of Technology, Opole 45-370, Poland
Department of Nanoscience, Joint School of Nanoscience and Nanoengineering, University of North Carolina at Greensboro, Greensboro, North Carolina 27401, United States
Équipe Verres et Céramiques (V&C), ISCR CNRS UMR 6226, Université de Rennes 1, Rennes 35042, France
Funding
National Science Foundation
References (32)
Show source-provided references
1. Adam J.-L. · 2014
2. Wang R. P. · 201410.1201/b15599 ↗
3. 10.1016/j.jpcs.2007.01.01710.1016/j.jpcs.2007.01.017 ↗
4. 10.1117/12.203673410.1117/12.2036734 ↗
5. 10.1038/nphoton.2011.30910.1038/nphoton.2011.309 ↗
6. 10.1002/adma.20100425510.1002/adma.201004255 ↗
7. 10.1016/j.jpowsour.2023.23324710.1016/j.jpowsour.2023.233247 ↗
8. 10.1364/OME.3.00104910.1364/OME.3.001049 ↗
9. Feltz A. · 1993
10. Borisova Z. U. · 198110.1007/978-1-4757-0851-6 ↗
11. Popescu M. · 2002
12. 10.1038/s41598-023-30160-710.1038/s41598-023-30160-7 ↗
13. 10.1021/acsaelm.2c0107510.1021/acsaelm.2c01075 ↗
14. 10.1364/OL.43.00038710.1364/OL.43.000387 ↗
15. 10.1103/PhysRevB.77.17220110.1103/PhysRevB.77.172201 ↗
16. 10.1039/c3tc30975d10.1039/c3tc30975d ↗
17. Moulder J. F. · 1992
18. 10.1002/1096-9918(200012)29:12<856:AID-SIA940>3.0.CO;2-810.1002/1096-9918(200012)29:12<856:AID-SIA940>3.0.CO;2-8 ↗
19. 10.1016/j.tca.2006.01.03110.1016/j.tca.2006.01.031 ↗
20. 10.1016/j.jallcom.2016.03.05410.1016/j.jallcom.2016.03.054 ↗
21. 10.1016/j.jallcom.2018.04.06610.1016/j.jallcom.2018.04.066 ↗
22. 10.1088/0022-3735/16/12/02310.1088/0022-3735/16/12/023 ↗
23. Ganjoo A. · J. Optoelectron. Adv. Mater. · 2008 · 10 · 1328
24. 10.1016/j.jallcom.2017.12.30310.1016/j.jallcom.2017.12.303 ↗
25. 10.1088/0268-1242/10/1/01110.1088/0268-1242/10/1/011 ↗
26. 10.1111/jace.1796010.1111/jace.17960 ↗
27. 10.1016/j.jallcom.2018.04.31610.1016/j.jallcom.2018.04.316 ↗
28. Mott N. F. · 1979
29. Ngai K. L. · 201110.1007/978-1-4419-7649-9 ↗
30. 10.1016/0167-2738(90)90010-O10.1016/0167-2738(90)90010-O ↗
31. 10.1134/S106378261104012910.1134/S1063782611040129 ↗
32. 10.1016/j.nocx.2023.10018810.1016/j.nocx.2023.100188 ↗