journal article·2023-05-23

Structural Optimized H-Gate High Schottky Barrier Bidirectional Tunnel Field Effect Transistor

Xi Liu, Mengmeng Li, Meng Li, Shouqiang Zhang, Xiaoshi Jin

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Abstract

In this work, we proposed a structural optimized H-shaped gate bidirectional tunnel field effect transistor with high on-state current based on high Schottky barrier plug-in source–drain contacts and central assistant gate (H-Gate HSB-BTFET). Compared to the previously proposed high Schottky barrier bidirectional tunnel field effect transistor (HSB-BTFET), the proposed H-Gate BTFET achieves excellent switching characteristics such as better forward on-state current, lower subthreshold swing (SS), lower power consumption, higher I on – I off ratio, and lower band to band tunneling (BTBT) induced leakage. The physical mechanism of device performance improvement is explained, analyzed, and compared with HSB-BTFET. In addition, no more complex process technology and expensive millisecond annealing process are needed; the proposed H-Gate BTFET can be used as an alternative candidate for mainstream integration technology.
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Research context

OpenAlex topics: Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices · Ferroelectric and Negative Capacitance Devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

School of Information Science and Engineering, Shenyang University of Technology, Shenyang 110870, China

Funding

National Natural Science Foundation of China

References (27)

Show source-provided references
1. 10.1016/j.mee.2007.04.03810.1016/j.mee.2007.04.038 ↗
2. 10.1186/s11671-019-2879-010.1186/s11671-019-2879-0 ↗
3. Kim, S. D.; Park, C. M.; Woo, J. C. S. Advanced model and analysis for series resistance in sub-100 nm CMOS including poly depletion and overlap doping gradient effect. In IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2000; pp 723–724.
4. 10.1002/jnm.232010.1002/jnm.2320 ↗
5. 10.1007/s12633-019-00170-010.1007/s12633-019-00170-0 ↗
6. 10.1016/j.mee.2007.12.01910.1016/j.mee.2007.12.019 ↗
7. 10.1186/s11671-023-03835-310.1186/s11671-023-03835-3 ↗
8. 10.1109/JEDS.2017.276290210.1109/JEDS.2017.2762902 ↗
9. 10.1109/TED.2015.246411210.1109/TED.2015.2464112 ↗
10. 10.1049/mnl.2015.004610.1049/mnl.2015.0046 ↗
11. 10.1109/LED.2010.204671310.1109/LED.2010.2046713 ↗
12. 10.1038/ncomms994810.1038/ncomms9948 ↗
13. 10.1038/nature1538710.1038/nature15387 ↗
14. 10.1109/LED.2015.247414710.1109/LED.2015.2474147 ↗
15. 10.1109/TED.2016.261937210.1109/TED.2016.2619372 ↗
16. 10.1016/j.mssp.2016.12.01110.1016/j.mssp.2016.12.011 ↗
17. 10.1166/jnn.2018.1557410.1166/jnn.2018.15574 ↗
18. 10.1186/s11671-021-03561-810.1186/s11671-021-03561-8 ↗
19. 10.1109/JEDS.2014.232662210.1109/JEDS.2014.2326622 ↗
20. 10.1109/JEDS.2015.239059110.1109/JEDS.2015.2390591 ↗
21. 10.1109/JEDS.2015.240037110.1109/JEDS.2015.2400371 ↗
22. 10.1109/LED.2016.258204110.1109/LED.2016.2582041 ↗
23. 10.1109/JEDS.2018.282563910.1109/JEDS.2018.2825639 ↗
24. 10.1109/JEDS.2020.302092010.1109/JEDS.2020.3020920 ↗
25. 10.1016/0038-1101(89)90029-410.1016/0038-1101(89)90029-4 ↗
26. Device Simulation─New Features in 2019 Baseline Release;https://www.silvaco.com/products/tcad/device_simulation/device_simulation.html (Accessed: Feb 2020).
27. 10.1006/spmi.2000.095410.1006/spmi.2000.0954 ↗