Influence of Interface on the Charge Carrier Mobility of La2Ti2O7 Layered Perovskite Thin Films Measured by the Time-of-Flight Method
Source abstract
Abstract
We report the electrical characterizations of La2Ti2O7 thin films synthetized by pulsed laser deposition. We observe a significant change in I–V curve in the presence of UV light. The conduction mechanism can be described by two regimes: ohmic at low voltage and space charge limited conduction for higher voltage. Finally, for the first time to our knowledge, the charge carrier mobility of this material is studied; we use the time-of-flight method to investigate this property. We explain the evolution of the carrier mobility with the applied voltage by the presence of a depletion layer between the film and the gold contact, which affects the measurements.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Semiconductor materials and devices · Electronic and Structural Properties of Oxides · Diamond and Carbon-based Materials Research
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Univ. Artois, CNRS, Centrale Lille, Univ. Lille, UMR 8181 – UCCS – Unité de Catalyse et Chimie du Solide, F-62300 Lens, France
ULCO, Unité de Dynamique et Structure des Matériaux Moléculaires (UDSMM) EA 4476, F-62100 Calais, France
Univ. Lille, CNRS, Centrale Lille, Univ. Artois, UMR 8181 – UCCS – Unité de Catalyse et Chimie du Solide, F-59000 Lille, France
References (38)
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