Feasibility of Large-Scale MoS2 Thin-Film Transistors on a GaN Substrate
Source abstract
Abstract
Two-dimensional (2D) materials have attracted much attention for their layered structures and diversity in electronic and optical properties. Sapphire and Si/SiO2 were the most common substrates for chemically synthesized MoS2. Here, we demonstrated high-quality large-scale MoS2 film grown by atomic layer deposition (ALD) on an Fe-doped free-standing GaN substrate. In addition, we fabricated excellent performance and highly uniform top-gate FETs based on MoS2, and the average electron mobility of MoS2 FETs was up to 3.54 cm2 V–1 s–1. Furthermore, Al2O3 was introduced to act as a hard mask to prevent direct contact of photoresist and MoS2, which was compatible for the fabrication process and ensured the homogeneity of electrical properties of each FET. Our work paves a new way for chemically synthesized wafer-scale MoS2 film, and it is promising to build large-scale integrated circuits other than FETs on a GaN substrate.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: 2D Materials and Applications · ZnO doping and properties · MXene and MAX Phase Materials
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai 200433, People’s Republic of China
State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, People’s Republic of China
College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060, People’s Republic of China
Funding
Ministry of Science and Technology of the People's Republic of China
References (26)
Show source-provided references
1. 10.1103/PhysRevLett.84.95110.1103/PhysRevLett.84.951 ↗
2. 10.1021/nn405213810.1021/nn4052138 ↗
3. 10.1088/2053-1583/aa9ea510.1088/2053-1583/aa9ea5 ↗
4. 10.1021/nn203715c10.1021/nn203715c ↗
5. 10.1038/nnano.2012.19310.1038/nnano.2012.193 ↗
6. 10.1021/acs.nanolett.5b0426010.1021/acs.nanolett.5b04260 ↗
7. 10.1038/nnano.2015.5610.1038/nnano.2015.56 ↗
8. 10.1021/nn502776h10.1021/nn502776h ↗
9. 10.1021/nl903868w10.1021/nl903868w ↗
10. 10.1002/smll.20110101610.1002/smll.201101016 ↗
11. 10.1021/nn202455710.1021/nn2024557 ↗
12. 10.1002/smll.20160315710.1002/smll.201603157 ↗
13. 10.1039/C5NR09032F10.1039/C5NR09032F ↗
14. 10.1063/1.489397810.1063/1.4893978 ↗
15. 10.1021/cr900056b10.1021/cr900056b ↗
16. 10.1116/1.481654810.1116/1.4816548 ↗
17. 10.1021/jp205116x10.1021/jp205116x ↗
18. 10.1021/nl204361210.1021/nl2043612 ↗
19. 10.1038/srep0186610.1038/srep01866 ↗
20. 10.1039/c2nr31833d10.1039/c2nr31833d ↗
21. 10.1116/1.494124510.1116/1.4941245 ↗
22. 10.1021/nl302015v10.1021/nl302015v ↗
23. Wang, H.; Yu, L.; Lee, Y.H.; Fang, W.; Hsu, A.; Herring, P.; Chin, M.; Dubey, M.; Li, L.J.; Kong, J. In Large-scale 2D electronics based on single-layer MoS 2 grown by chemical vapor deposition; Electron Devices Meeting (IEDM), 2012 IEEE International, IEEE: 2012; pp 4.6.1–4.6.4.10.1109/IEDM.2012.6478980 ↗
24. Yu, L.; El-Damak, D.; Ha, S.; Ling, X.; Lin, Y.; Zubair, A.; Zhang, Y.; Lee, Y.H.; Kong, J.; Chandrakasan, A. In Enhancement-mode single-layer CVD MoS2 FET technology for digital electronics; Electron Devices Meeting (IEDM), 2015 IEEE International, IEEE: 2015; pp 32.3.1–32.3.4.10.1109/IEDM.2015.7409814 ↗
25. 10.1021/nn102598m10.1021/nn102598m ↗
26. 10.1021/nl400747910.1021/nl4007479 ↗