Metal-Assisted Chemical Etching of p-type Si Nanopillars with Doping Level of 10 20 cm –3
Source abstract
Abstract
High Resolution Image Download MS PowerPoint Slide Silicon nanopillars (SiNPs) are quasi-1D Si nanostructures extending normally to the substrate. As Si nanowires, SiNPs display large surface-to-volume ratios and a remarkable reduction of their thermal conductivity by almost a factor one-hundred compared to bulk Si. SiNPs have found applications in energy-related fields, including thermoelectrics and photovoltaics, and in chemical sensing and biosensing. Among the available preparation techniques, Metal-Assisted Chemical Etching (MACE) has been extensively used to prepare high density SiNP forests, as the method is facile and scalable. However, while MACE lets easily obtain low-to-medium doped SiNPs, p –type SiNPs with doping level ≥ 10 20 cm –3, essential for energetic applications, could never be obtained. In this paper we provide evidence that this is related to the competition between metal-assisted and noncatalyzed etching. Thus, guided by a model of the silicon–solution and silicon–metal–solution interfaces, we could develop a strategy that enabled for the first time the preparation by MACE of p –type SiNPs with doping levels as large as 10 20 cm –3, using Au as the catalyst and Na 2 S 2 O 8 as the oxidizing agent. The possibility of preparing heavily doped SiNPs largely extends MACE application to critical technological fields spanning from thermoelectrics and photovoltaics to batteries and sensing.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Nanowire Synthesis and Applications · Silicon Nanostructures and Photoluminescence · Anodic Oxide Films and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Materials Science, University of Milano Bicocca, via R. Cozzi 55, I−20125 Milan, Italy
Funding
Ministero dell'Universit? e della Ricerca · NextGenerationEU
References (45)
Show source-provided references
1. 10.1038/nature0638110.1038/nature06381 ↗
2. 10.1038/nature0645810.1038/nature06458 ↗
3. 10.1002/smll.20050013710.1002/smll.200500137 ↗
4. 10.1016/j.solmat.2022.11214310.1016/j.solmat.2022.112143 ↗
5. 10.1038/nnano.2007.41110.1038/nnano.2007.411 ↗
6. 10.1002/cssc.20240077710.1002/cssc.202400777 ↗
7. 10.1016/S0009-2614(02)02008-010.1016/S0009-2614(02)02008-0 ↗
8. 10.1038/nbt113810.1038/nbt1138 ↗
9. 10.1038/nmat209010.1038/nmat2090 ↗
10. 10.3390/ma1503121410.3390/ma15031214 ↗
11. 10.1016/j.cossms.2011.11.00210.1016/j.cossms.2011.11.002 ↗
12. 10.1002/adma.20100178410.1002/adma.201001784 ↗
13. 10.1063/1.131919110.1063/1.1319191 ↗
14. 10.1016/j.electacta.2008.03.00910.1016/j.electacta.2008.03.009 ↗
15. 10.1021/jp077053o10.1021/jp077053o ↗
16. 10.1063/5.013211610.1063/5.0132116 ↗
17. 10.1088/1361-6528/ad59ad10.1088/1361-6528/ad59ad ↗
18. 10.1016/j.cej.2025.16563210.1016/j.cej.2025.165632 ↗
19. 10.1016/j.enconman.2024.11926810.1016/j.enconman.2024.119268 ↗
20. 10.1021/acsami.5c0056410.1021/acsami.5c00564 ↗
21. 10.3390/nano1102038310.3390/nano11020383 ↗
22. 10.1002/aesr.20240008010.1002/aesr.202400080 ↗
23. 10.1021/nl202674t10.1021/nl202674t ↗
24. 10.1021/jp407720e10.1021/jp407720e ↗
25. 10.1021/acsami.6b0102010.1021/acsami.6b01020 ↗
26. 10.1088/2053-1591/aca00810.1088/2053-1591/aca008 ↗
27. 10.1016/j.electacta.2012.12.07510.1016/j.electacta.2012.12.075 ↗
28. 10.1021/acs.nanolett.0c0022710.1021/acs.nanolett.0c00227 ↗
29. 10.3390/ma1707154910.3390/ma17071549 ↗
30. 10.1016/0304-386X(95)00032-C10.1016/0304-386X(95)00032-C ↗
31. 10.3390/min1504034010.3390/min15040340 ↗
32. 10.1021/acsaelm.3c0101410.1021/acsaelm.3c01014 ↗
33. 10.1088/1361-6528/ab9b4710.1088/1361-6528/ab9b47 ↗
34. 10.1103/PhysRevB.27.98510.1103/PhysRevB.27.985 ↗
35. 10.1103/PhysRevB.66.19520610.1103/PhysRevB.66.195206 ↗
36. 10.1103/PhysRevB.22.482510.1103/PhysRevB.22.4825 ↗
37. 10.1103/PhysRevB.35.592110.1103/PhysRevB.35.5921 ↗
38. 10.1016/0022-3093(79)90085-110.1016/0022-3093(79)90085-1 ↗
39. 10.1134/S106378261008015410.1134/S1063782610080154 ↗
40. 10.1134/1.178878910.1134/1.1788789 ↗
41. 10.1016/0038-1098(86)90513-210.1016/0038-1098(86)90513-2 ↗
42. 10.1103/PhysRevB.73.03330710.1103/PhysRevB.73.033307 ↗
43. 10.1002/adem.20170089310.1002/adem.201700893 ↗
44. 10.1038/s41467-021-24208-310.1038/s41467-021-24208-3 ↗
45. Hull, R. Properties of crystalline silicon ; INSPEC, The Institution of Electrical Engineers, 1999; p 1042.