journal article·2009-05

Quasi-static and dynamic piezoelectric d33 coefficients of irradiation cross-linked polypropylene ferroelectrets

Xiaoqing Zhang, Xuewen Wang, Jinfeng Huang, Zhongfu Xia

Journal of Materials Science· Volume 44· Issue 10
Publisher page

Abstract

Irradiation cross-linked polypropylene (IXPP) foams show high piezoelectric activity after proper hot-pressing treatment and corona charging. Quasi-static piezoelectric d33 coefficients around 400 pC/N were measured by means of the direct piezoelectric effect. Dynamic values of the inverse piezoelectric d33 coefficients, determined from the dielectric resonance spectra at 220 kHz, is about 68% of the quasi-static d33 values. The difference between the quasi-static and the dynamic values of d33 is probably due to the enhancement of Young’s modulus of IXPP with increasing frequency. The piezoelectric d33 coefficients are slightly dependent on the applied pressure in the range up to 50 kPa. The d33-values decrease by 70% when the samples are exposed to 90 °C for 1 day; and a pre-aging treatment improves the thermal stability of the d33 coefficients.
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Research context

OpenAlex topics: High voltage insulation and dielectric phenomena · Dielectric materials and actuators · Smart Materials for Construction

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References (32)

Show source-provided references
1. Bauer S, Gerhard-Multhaupt R, Sessler GM (2004) Phys Today 57(2):3710.1063/1.1688068 ↗
2. Lindner M, Hoislbauer H, Schwödiauer R et al (2004) IEEE Trans Dielectr Electr Insul 11:25510.1109/TDEI.2004.1285895 ↗
3. Bauer S (2006) IEEE Trans Dielectr Electr Insul 13:95310.1109/TDEI.2006.247819 ↗
4. Wegener M, Bauer S (2005) ChemPhysChem 6:101410.1002/cphc.200400517 ↗
5. Zhang X, Sessler GM, Hillenbrand J (2007) J Electrostat 65:9410.1016/j.elstat.2006.07.006 ↗
6. Zhang X, Hillenbrand J, Sessler GM (2004) Appl Phys Lett 85:122610.1063/1.1781388 ↗
7. Paajanen M, Wegener M, Gerhard-Multhaupt R (2001) J Phys D Appl Phys 34:248210.1088/0022-3727/34/16/313 ↗
8. Zhang X, Hillenbrand J, Sessler GM (2004) J Phys D Appl Phys 37:214610.1088/0022-3727/37/15/015 ↗
9. Hillenbrand J, Zhang X, Zhang Y et al (2003) Annual report on IEEE conference on electrical insulation and dielectric phenomena. IEEE, New York, pp 40–43
10. Saarimäki E, Paajanen M, Savijärvi et al (2006) IEEE Trans Dielectr Electr Insul 13:96310.1109/TDEI.2006.247820 ↗
11. Montanari GC, Fabiani D, Ciani F et al (2005) Annual report on IEEE conference on electrical insulation and dielectric phenomena. IEEE, New York, pp 552–556
12. Wegener M, Wirges W, Dietrich JP et al (2005) Proceedings of the 12th international symposium on electrets. Salvador, Bahia, Brazil, pp 28–30
13. Fang P, Wegener M, Wirges W et al (2007) Appl Phys Lett 90:19290810.1063/1.2738365 ↗
14. Zhang X, Hillenbrand J, Sessler GM (2007) J Appl Phys 101:05411410.1063/1.2562413 ↗
15. Altafim RAC, Basso HC, Concalves Neto L et al (2005) Annual report on IEEE conference on electrical insulation and dielectric phenomena. IEEE, New York, pp 669–672
16. Hu Z, von Seggern H (2006) J Appl Phys 99:02410210.1063/1.2161825 ↗
17. Kressmann R (2001) J Acoust Soc Am 109:141210.1121/1.1354989 ↗
18. Hillenbrand J, Sessler GM (2004) J Acoust Soc Am 116:326710.1121/1.1810272 ↗
19. Zhang X, Huang J, Chen J et al (2007) Appl Phys Lett 91:18290110.1063/1.2803316 ↗
20. Sessler GM, Hillenbrand J (1999) Appl Phys Lett 75:340510.1063/1.125308 ↗
21. Hu Z, von Seggern H (2005) J Appl Phys 98:01410810.1063/1.1939067 ↗
22. Hillenbrand J, Sessler GM (2000) IEEE Trans Dielectr Electr Insul 7:53710.1109/94.868074 ↗
23. Jonscher AK (1983) Dielectric relaxation in solids. Chelsea Dielectrics Press, London
24. Havriliak S, Havriliak SJ (1997) Dielectric and mechanical relaxation in materials. Hanser, Munich
25. IEEE Standard on Piezoelectricity (1987) ANSI/IEEE Std. 176–1987, pp 46–59
26. Jonscher AK (1999) J Phys D Appl Phys 32:R5710.1088/0022-3727/32/14/201 ↗
27. Neugschwandtner GS, Schwödiauer R, Vieytes M et al (2000) Appl Phys Lett 77:382710.1063/1.1331348 ↗
28. Mellinger A (2003) IEEE Trans Dielectr Electr Insul 10:84210.1109/TDEI.2003.1237333 ↗
29. Ohigashi H (1976) J Appl Phys 47:94910.1063/1.322685 ↗
30. Omote K, Ohigashi H, Koga K (1997) J Appl Phys 81:276010.1063/1.364300 ↗
31. Neugschwandtner GS, Schwödiauer R, Bauer-Gogonea S et al (2001) J Appl Phys 89:450310.1063/1.1355719 ↗
32. Dansachmüller M, Schwödiauer R, Bauer S et al (2005) Appl Phys Lett 86:03191010.1063/1.1854740 ↗