DataVXACS Applied Electronic MaterialsPaper
journal article·2023-03-28

Systematic Investigation of Ferroelectric Properties in x%YO1.5–(100–x%)Hf1–yZryO2 Films

Takanori Mimura, Yuki Tashiro, Takao Shimizu, Hiroshi Funakubo

ACS Applied Electronic Materials· Volume 5· Issue 3
Publisher page
Source abstract

Abstract

The effect of composition on the ferroelectric properties was investigated using epitaxial x %YO 1.5 –(100– x %)Hf 1– y Zr y O 2 films. The tetragonal phase, with a composition near the phase boundaries with the orthorhombic or monoclinic phase, exhibits ferroelectricity through the field-induced phase transition from the tetragonal to the orthorhombic phase. Remarkably, the orthorhombic phase generated via the field-induced phase transition has a lower coercive field ( E c ). The E c could be controlled from 1400 (5%YO 1.5 –95%(Hf 0.50 Zr 0.50 )O 2 ) to 2400 kV/cm (5%YO 1.5 –95%(Hf 0.75 Zr 0.25 )O 2 ) with the same remnant polarization ( P r ) value of ∼17 μC/cm 2 . These results are important for ferroelectric device applications with low-voltage drives.
Source: openalex_inverted_index · Quality: baseline

Research context

Electronic materials

OpenAlex topics: Ferroelectric and Negative Capacitance Devices · MXene and MAX Phase Materials · Semiconductor materials and devices

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Materials Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan

Department of Chemistry, Faculty of Science, Gakushuin University, 1-5-1 Mejiro, Toshima-ku 171-8588, Japan

Research Center for Functional Materials, National Institute for Materials Science, 1-2-1, Sengen, Tsukuba-shi, Ibaraki 305-0047, Japan

Materials Research Center for Element Strategy (Tokyo Tech MCES), Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama, Kanagawa 226-8503, Japan

Funding

Ministry of Education, Culture, Sports, Science and Technology · Murata Science Foundation

References (33)

Show source-provided references
1. 10.1063/1.363405210.1063/1.3634052 ↗
2. 10.1111/j.1151-2916.2001.tb00843.x10.1111/j.1151-2916.2001.tb00843.x ↗
3. 10.1063/1.491913510.1063/1.4919135 ↗
4. 10.1063/1.492745010.1063/1.4927450 ↗
5. 10.1016/j.tsf.2016.07.00910.1016/j.tsf.2016.07.009 ↗
6. 10.1063/1.481148310.1063/1.4811483 ↗
7. 10.1063/1.366720510.1063/1.3667205 ↗
8. 10.1063/1.492780510.1063/1.4927805 ↗
9. 10.1063/1.491670710.1063/1.4916707 ↗
10. 10.1063/1.494037010.1063/1.4940370 ↗
11. 10.1557/mrc.2018.17510.1557/mrc.2018.175 ↗
12. 10.1109/TED.2018.285681810.1109/TED.2018.2856818 ↗
13. 10.1109/LED.2019.294496010.1109/LED.2019.2944960 ↗
14. 10.1109/LED.2019.290364110.1109/LED.2019.2903641 ↗
15. 10.1109/LED.2017.277139010.1109/LED.2017.2771390 ↗
16. 10.1149/2.0081505jss10.1149/2.0081505jss ↗
17. 10.1557/mrs.2018.9210.1557/mrs.2018.92 ↗
18. 10.1038/s41563-020-00897-x10.1038/s41563-020-00897-x ↗
19. 10.1021/acsaelm.1c0067210.1021/acsaelm.1c00672 ↗
20. 10.1021/acsaelm.1c0012210.1021/acsaelm.1c00122 ↗
21. 10.1021/acsaelm.1c0034210.1021/acsaelm.1c00342 ↗
22. 10.35848/1347-4065/ac80e910.35848/1347-4065/ac80e9 ↗
23. 10.1016/j.apmt.2022.10166110.1016/j.apmt.2022.101661 ↗
24. 10.1063/1.504001810.1063/1.5040018 ↗
25. 10.1103/PhysRevMaterials.5.11440710.1103/PhysRevMaterials.5.114407 ↗
26. 10.1063/5.004093410.1063/5.0040934 ↗
27. 10.1002/pssr.20200058910.1002/pssr.202000589 ↗
28. 10.1002/aelm.20160017310.1002/aelm.201600173 ↗
29. 10.1063/1.502174610.1063/1.5021746 ↗
30. 10.1103/PhysRevB.90.06411110.1103/PhysRevB.90.064111 ↗
31. 10.1007/s10825-017-1077-510.1007/s10825-017-1077-5 ↗
32. 10.1103/PhysRevApplied.14.06401210.1103/PhysRevApplied.14.064012 ↗
33. 10.1007/s40843-022-2124-710.1007/s40843-022-2124-7 ↗