Dopants and Traps in Nanocrystal-Based Semiconductor Thin Films: Origins and Measurement of Electronic Midgap States
Source abstract
Abstract
Different models are proposed to explain the origin of electronic midgap states that limit charge transport in nanocrystal thin films. Here, we investigate midgap states using optoelectronic and electrochemical techniques, supported by theoretical calculations. We find that charge trapping in PbS NC thin films can be explained by (1) nanocrystal dimerization and (2) charging of doped nanocrystals. In these models, there are no states within the band gap of individual nanocrystals; the nanocrystals themselves act as trap states. These findings allow us to formulate strategies to improve transport by increasing free carrier densities while reducing the number density of trap states.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Quantum Dots Synthesis And Properties · Chalcogenide Semiconductor Thin Films · Copper-based nanomaterials and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Information Technology and Electrical Engineering, ETH Zurich, Gloriastrasse 35, 8092 Zurich, Switzerland
Funding
Schweizerischer Nationalfonds zur F?rderung der Wissenschaftlichen Forschung · NCCR Quantum Science and Technology
References (29)
Show source-provided references
1. 10.1021/cr900137k10.1021/cr900137k ↗
2. 10.1039/C6CC05571K10.1039/C6CC05571K ↗
3. 10.1038/nmat452610.1038/nmat4526 ↗
4. 10.1021/nn500897c10.1021/nn500897c ↗
5. 10.1021/acs.jpclett.8b0010910.1021/acs.jpclett.8b00109 ↗
6. 10.1021/jz501508610.1021/jz5015086 ↗
7. Yazdani, N.; Andermatt, S.; Yarema, M.; Farto, V.; Bani-Hashemian, M. H.; Volk, S.; Lin, W.; Yarema, O.; Luisier, M.; Wood, V. Charge Transport in Semiconductors Assembled from Nanocrystals. 2019, arXiv:1909.09739v1.10.1038/s41467-020-16560-7 ↗
8. 10.1126/science.aac552310.1126/science.aac5523 ↗
9. 10.1038/ncomms718010.1038/ncomms7180 ↗
10. 10.1021/nl402803h10.1021/nl402803h ↗
11. 10.1038/ncomms149210.1038/ncomms1492 ↗
12. 10.1038/srep0222510.1038/srep02225 ↗
13. 10.1021/nl802476m10.1021/nl802476m ↗
14. 10.1039/C2CS35241A10.1039/C2CS35241A ↗
15. 10.1039/C8CS00629F10.1039/C8CS00629F ↗
16. 10.1002/adma.20130416610.1002/adma.201304166 ↗
17. 10.1021/acs.chemmater.6b0464810.1021/acs.chemmater.6b04648 ↗
18. 10.1038/nnano.2012.12710.1038/nnano.2012.127 ↗
19. 10.1021/acs.jpclett.7b0219310.1021/acs.jpclett.7b02193 ↗
20. 10.1021/acs.chemmater.9b0139510.1021/acs.chemmater.9b01395 ↗
21. 10.1021/jz400125r10.1021/jz400125r ↗
22. 10.1021/am800158310.1021/am8001583 ↗
23. 10.1021/nl303322k10.1021/nl303322k ↗
24. 10.1016/j.matt.2019.05.01510.1016/j.matt.2019.05.015 ↗
25. 10.1063/1.144620710.1063/1.1446207 ↗
26. Haynes W. M. · 2008
27. 10.1021/acs.jpclett.8b0328310.1021/acs.jpclett.8b03283 ↗
28. 10.1038/ncomms398110.1038/ncomms3981 ↗
29. 10.1038/srep1873510.1038/srep18735 ↗