journal article·2024-11-26

Analysis of Leaky Integrate-and-Fire Neuron Using Al2O3/Si3N4 Gate Insulator Stack for Spiking Neural Network

Min-Kyu Park, Joon Hwang, Jonghyun Ko, Jeonghyun Kim, Jong-Ho Bae, Jong-Ho Lee

ACS Applied Electronic Materials· Volume 6· Issue 11
Publisher page

Abstract

Leaky integrate-and-fire (LIF)-based spiking neural networks (SNNs) are analyzed using a field-effect transistor (FET)-type neuron device with a charge trap insulator stack (Al 2 O 3 /Si 3 N 4 ). By using both the memory functionality and the poor retention characteristic of the device, we successfully implemented the LIF function. SPICE modeling of the device and LIF circuit demonstrated that the large membrane capacitor in a neuron circuit could be replaced, which promises a smaller area and lower energy consumption (∼0.3 pJ/spike). Based on the measured properties, spiking neural networks are simulated to find the optimal leaky constant while maintaining a low operational voltage.
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Research context

OpenAlex topics: Advanced Memory and Neural Computing · Neuroscience and Neural Engineering · Neural Networks and Applications

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Affiliations

Department of Electrical and Computer Engineering and ISRC, Seoul National University, Seoul 08826, Korea

School of Electrical Engineering, Kookmin University, Seoul 02707, Korea

Funding

National Research Foundation of Korea · Brain Korea 21 Plus Project

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