Analysis of Leaky Integrate-and-Fire Neuron Using Al2O3/Si3N4 Gate Insulator Stack for Spiking Neural Network
Source abstract
Abstract
Leaky integrate-and-fire (LIF)-based spiking neural networks (SNNs) are analyzed using a field-effect transistor (FET)-type neuron device with a charge trap insulator stack (Al 2 O 3 /Si 3 N 4 ). By using both the memory functionality and the poor retention characteristic of the device, we successfully implemented the LIF function. SPICE modeling of the device and LIF circuit demonstrated that the large membrane capacitor in a neuron circuit could be replaced, which promises a smaller area and lower energy consumption (∼0.3 pJ/spike). Based on the measured properties, spiking neural networks are simulated to find the optimal leaky constant while maintaining a low operational voltage.
Source: openalex_inverted_index · Quality: baseline
Research context
OpenAlex topics: Advanced Memory and Neural Computing · Neuroscience and Neural Engineering · Neural Networks and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
Affiliations
Department of Electrical and Computer Engineering and ISRC, Seoul National University, Seoul 08826, Korea
School of Electrical Engineering, Kookmin University, Seoul 02707, Korea
Funding
National Research Foundation of Korea · Brain Korea 21 Plus Project
References (28)
Show source-provided references
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