journal article·2024-03-26

Achieving Adsorbate-Free Monolayered MoS2 Field Effect Transistors by Controlled Surface Gas Treatment

Junsung Byeon, Jaesik Eom, Taehun Kim, Jungmoon Lim, Min Jung, Younghoon Lim, Hongju Park, John Hong, Sangyeon Pak, SeungNam Cha

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Abstract

Monolayered transition metal dichalcogenides (TMDCs) possess a highly sensitive nature to external elements, particularly adsorbed molecules on the surface such as H 2 O or O 2 molecules, due to their atomically thin structure. In this sense, it is important to develop a strategy to obtain a pristine surface of 2D TMDCs for the successful and reliable fabrication of a device with their originally intended functions. Here, we suggest a facile strategy of surface treatment to effectively eliminate the influence of adsorbed molecules in the electrical performance of the monolayered MoS 2 FETs via surface treatment using highly reactive H 2 S gas at room temperature. We demonstrated increased carrier concentration of absorbate-free MoS 2 using various spectroscopy and electrical measurements. The H 2 S-treated MoS 2 FETs showed a 171% increase in on-current level and reduced hysteresis window compared to pristine MoS 2 FETs. Moreover, the H 2 S-treated MoS 2 FETs exhibit increased field effect mobility. Additionally, we verified that the clean interface of MoS 2 is preserved through dry passivation of MoS 2 FETs. This unique room temperature surface treatment strategy allows the development of highly conductive MoS 2 FETs with a clean surface by a very simple process.
Source: openalex_inverted_index · Quality: baseline

Research context

OpenAlex topics: 2D Materials and Applications · MXene and MAX Phase Materials · Perovskite Materials and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Department of Physics, Sungkyunkwan University (SKKU), Suwon, Gyeonggi-do 16419, Republic of Korea

School of Materials Science and Engineering, Kookmin University, Seoul 02707, Republic of Korea

School of Electronic and Electrical Engineering, Hongik University, Seoul 04066, Republic of Korea

Funding

National Research Foundation of Korea

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