Source abstract
Abstract
Two-dimensional (2D) van der Waals (vdW) materials have been proven to be functional materials with excellent performance among flexible functional optoelectronics. Static strain may have a great influence on photoinduced charge carriers in a 2D vdW piezoelectric semiconductor. However, only a few works pay attention to the static-strain-modulated photoresponsivity of 2D vdW ferroelectric materials. α-In2Se3, a 2D vdW ferroelectric semiconductor from the family of III–VI compounds in the form of III2–VI3, has attracted considerable attention for the study of high-performance nanodevices. In this study, we investigate a flexible α-In2Se3-based transistor on a polyethylene terephthalate substrate. A competitive mechanism of carrier mobility and piezoelectric/ferroelectric polarization exists in the transistor when in-plane strain is applied. The carrier mobility modulates separation and transport of electron–hole pairs, whereas piezoelectric/ferroelectric polarization charges modulate the local band profile tilting. The optimized photoresponsivity is increased by 200% (illumination intensity is about 454 μW/cm2) while introducing a −0.15% compressive strain when the wavelength of the laser is about 405 nm. Our results reveal the strain-modulated photoresponsivity in an α-In2Se3-based flexible transistor, which may offer an approach to understand strain-modulated flexible functional optoelectronics.
Source: openalex_inverted_index · Quality: baseline
Affiliations
Key Laboratory of Low-dimensional Materials and Application Technology, School of Materials Science and Engineering, Xiangtan University, Hunan, Xiangtan 411105, China
Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory, Guangdong, Guangzhou 510610, China
Funding
Natural Science Foundation of?Hunan Province · National Natural Science Foundation of China · Open Project Program of Key Laboratory of Low Dimensional Materials & Application Technology, Ministry of Education, China · Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory