Illumination instabilities in ZnO/HfO2 thin-film transistors and influence of grain boundary charge
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Abstract
Abstract
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Source: crossref · Quality: short
Research context
OpenAlex topics: Thin-Film Transistor Technologies · ZnO doping and properties · Nanowire Synthesis and Applications
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References (12)
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1. 10.1063/1.33058310.1063/1.330583 ↗
2. 10.1109/TED.2011.213814310.1109/TED.2011.2138143 ↗
3. 10.1109/TDMR.2008.91630710.1109/TDMR.2008.916307 ↗
4. 10.1063/1.351340010.1063/1.3513400 ↗
5. 10.1109/LED.2010.207343910.1109/LED.2010.2073439 ↗
6. Light effects on the bias stability of transparent ZnO thin film transistors
7. 10.1109/TED.2012.218904810.1109/TED.2012.2189048 ↗
8. 10.1109/TDMR.2010.206956110.1109/TDMR.2010.2069561 ↗
9. 10.1007/s13391-011-0301-x10.1007/s13391-011-0301-x ↗
10. 10.1088/0268-1242/26/3/03400810.1088/0268-1242/26/3/034008 ↗
11. 10.1063/1.343244510.1063/1.3432445 ↗
12. 10.1117/12.84966610.1117/12.849666 ↗