Synchrotron radiation photoelectron spectroscopy study of ITO surface

B Lai; X.M Ding; Z.L Yuan; X Zhou; L.S Liao; S.K Zhang; S Yuan; X.Y Hou; E.D Lu; P.S Xu; X.Y Zhang

doi:10.1016/s0169-4332(99)00515-2

journal article·2000-03

Synchrotron radiation photoelectron spectroscopy study of ITO surface

B Lai, X.M Ding, Z.L Yuan, X Zhou, L.S Liao, S.K Zhang, S Yuan, X.Y Hou, E.D Lu, P.S Xu, X.Y Zhang

Applied Surface Science· Volume 157· Issue 1-2

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Abstract

Abstract Synchrotron radiation photoelectron spectroscopy (SRPES) has been applied to surface analysis of indium tin oxide (ITO) thin films. Several different components of In and Sn were observed at the clean ITO surface. By comparing the chemical compositions of the film before and after vacuum annealing, the contents of In 2 O 3− x and Sn 3 O 4 were found to be the major factors influencing the electrical conductivity and optical transparency of the film.

Source: openaire · Quality: candidate unverified · Source record ↗

Research context

Materials processing

OpenAlex topics: ZnO doping and properties · Organic Light-Emitting Diodes Research · Organic Electronics and Photovoltaics

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

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