journal article·1996-02

Porous silicon studied by SiL23 soft X-ray emission

R.S. Crisp, D. Haneman, R. Sabet-Dariani

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Abstract

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Research context

OpenAlex topics: Silicon Nanostructures and Photoluminescence · Semiconductor materials and devices · Thin-Film Transistor Technologies

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References (10)

Show source-provided references
1. Canham · Appl. Phys. Lett. · 1990 · 57 · 104610.1063/1.103561 ↗
2. Tsai · Appl. Phys. Lett. · 1992 · 60 · 170010.1063/1.107190 ↗
3. Kurmaev · J. Non-Cryst. Solids · 1985 · 70 · 18710.1016/0022-3093(85)90318-7 ↗
4. Crisp · J. Phys. F · 1983 · 10 · 231310.1088/0305-4608/10/10/026 ↗
5. Sabet-Dariani · J. Appl. Phys. · 1993 · 73 · 232110.1063/1.353136 ↗
6. Crisp · J. Phys.: Condens. Matter · 1991 · 3 · 963710.1088/0953-8984/3/48/006 ↗
7. Sabet-Dariani · J. Appl. Phys. · 1994 · 76 · 134610.1063/1.357801 ↗
8. Sabet-Dariani · J. Appl. Phys. · 1994 · 75 · 800810.1063/1.356539 ↗
9. Roy · Appl. Phys. Lett. · 1992 · 61 · 165510.1063/1.108442 ↗
10. Friedersdorf · Appl. Phys. Lett. · 1992 · 60 · 228510.1063/1.107056 ↗